em78p210n ELAN Microelectronics Corp, em78p210n Datasheet - Page 71

• Manufacturer Part Number: em78p210n
• Description: 8-bit Microcontroller With Otp Rom
• Manufacturer: ELAN Microelectronics Corp

C Quality Assurance and Reliability
Product Specification (V1.2) 04.22.2008
(This specification is subject to change without further notice)
Solderability
Pre-condition
Temperature cycle test
Pressure cooker test
High temperature /
High humidity test
High-temperature
storage life
High-temperature
operating life
Latch-up
ESD (HBM)
ESD (MM)
Test Category
C.1 Address Trap Detect
An address trap detect is one of the MCU embedded fail-safe functions that detects
MCU malfunction caused by noise or the like. Whenever the MCU attempts to fetch an
instruction from a certain section of ROM, an internal recovery circuit is auto started. If
a noise caused address error is detected, the MCU will repeat execution of the program
until the noise is eliminated. The MCU will then continue to execute the next program.
Solder temperature=245±5 ° C, for 5 seconds up to the
stopper using a rosin-type flux
Step 1: TCT, 65 ° C (15 mins)~150 ° C (15 mins), 10 cycles
Step 2: Bake at 125 ° C, TD (endurance)=24 hrs
Step 3: Soak at 30 ° C/60% , D (endurance)=192 hrs
Step 4: IR flow 3 cycles
-65°C (15 mins) ~ 150 ° C (15 mins), 200 cycles
TA =121 ° C, RH=100%, pressure=2 atm,
TD (endurance)= 96 hrs
TA=85 ° C, RH=85% , TD (endurance)=168, 500 hrs
TA=150 ° C, TD (endurance)=500, 1000 hrs
TA=125 ° C, VCC=Max. operating voltage,
TD (endurance) =168, 500, 1000 hrs
TA=25 ° C, VCC=Max. operating voltage, 150mA/20V
TA=25 ° C, ± 3KV
TA=25 ° C, ± 300V
(Pkg thickness: 2.5mm or
(Pkg thickness: 2.5mm or
Pkg volume: 350mm
Pkg volume: 350mm
Test Conditions
3
3
----225±5 ° C)
----240±5 ° C)
8-Bit Microcontroller with OTP ROM
For SMD IC (such as
SOP, QFP, SOJ, etc)
IP_ND,OP_ND,IO_ND
IP_NS,OP_NS,IO_NS
IP_PD,OP_PD,IO_PD,
IP_PS,OP_PS,IO_PS,
VDD-VSS(+),VDD_VS
S (-) mode
Remarks
EM78P210N
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