IDT71T75602 Integrated Device Technology, IDT71T75602 Datasheet - Page 13

• Manufacturer Part Number: IDT71T75602
• Description: 512K x 36/ 1M x 18 2.5V Synchronous ZBT SRAMs 2.5V I/O/ Burst Counter Pipelined Outputs
• Manufacturer: Integrated Device Technology

NOTE:
1. The LBO, TMS, TDI, TCK and TRST pins will be internally pulled to V
NOTES:
1. All values are maximum guaranteed values.
2. At f = f
3. For I/Os V
Symbol
IDT71T75602, IDT71T75802, 512K x 36, 1M x 18, 2.5V Synchronous ZBT™ SRAMs with
2.5V I/O, Burst Counter, and Pipelined Outputs
I
I
I
I
Symbol
SB1
SB2
SB3
I
DD
ZZ
V
(Typical, ns)
V
|I
|I
|I
LO
OL
OH
LI
LI
|
|
|
Operating Power
Supply Current
CMOS Standby Power
Supply Current
Clock Running Power
Supply Current
Idle Power
Supply Current
Full Sleep Mode
Supply Current
t
MAX,
CD
Figure 2. Lumped Capacitive Load, Typical Derating
HD
inputs are cycling at the maximum frequency of read cycles of 1/t
Input Leakage Current
Output Leakage Current
Output Low Voltage
Output High Voltage
6
5
4
3
2
1
= V
Parameter
DDQ
20 30 50
, JTAG and ZZ Input Leakage Current
– 0.2V, V
I/O
Capacitance (pF)
80
LD
= 0.2V. For other inputs V
100
Parameter
Device Selected, Outputs Open,
Device Deselected, Outputs Open,
Device Deselected, Outputs Open,
Device Selected, Outputs Open,
Device Selected, Outputs Open,
ADV/
V
V
f = 0
V
f = f
V
V
Figure 1. AC Test Load
IN
DD
DD
IN
IN
> V
MAX
> V
> V
= Max., V
(2,3)
= Max., V
Z
> V
< V
0
IH
(2.3)
HD
HD
= X, V
IH
= 50
or < V
IH
, V
or < V
or < V
, V
Test Conditions
DD
DD
IN
IN
DD
IL
= Max.,
> V
> V
LD
LD
= Max.,
, f = f
= Max.,
, f = f
, f = f
5313 drw 05
HD
HD
50
200
MAX
or < V
or < V
MAX
MAX
V
(1)
(2)
HD
DDQ
(2,3)
(2,3)
5313 drw 04
LD
LD
,
= V
,ZZ > V
,
,
/2
DD
DD
, and the ZZ pin will be internally pulled to V
HD
– 0.2V, V
I
I
V
V
V
OL
OH
,
DD
DD
OUT
6.42
Com'l Only Com'l Only Com'l
= +6mA, V
= -6mA, V
225MHz
= Max., V
= Max., V
13
= 0V to V
CYC
315
40
90
60
40
LD
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Timing Reference Levels
AC Test Load
; f=0 means no input lines are changing.
= 0.2V.
DD
DD
IN
IN
DDQ
200MHz
Test Conditions
= 0V to V
= 0V to V
= Min.
= Min.
275
40
80
60
40
, Device Deselected
Commercial and Industrial Temperature Ranges
245
DD
DD
40
70
60
40
166MHz
265
Ind
60
90
80
60
SS
Com'l
215
40
60
60
40
150MHz
if they are not actively driven in the application.
235
Ind
60
80
80
60
Com'l
195
40
50
60
40
133MHz
Min.
2.0
___
___
___
___
215
Ind
60
70
80
60
See Figure 1
Com'l
0 to 2.5V
(V
(V
175
40
45
60
40
Max.
100MHz
0.4
DDQ
DDQ
30
___
2ns
5
5
/2)
/2)
195
Ind
60
65
80
60
5313 tbl 21
5313 tbl 23
5313 tbl 22
Unit
µ A
µA
µ A
V
V
Unit
mA
mA
mA
mA
mA