A3PE1500-1FG896 ACTEL [Actel Corporation], A3PE1500-1FG896 Datasheet - Page 34
A3PE1500-1FG896
Manufacturer Part Number
A3PE1500-1FG896
Description
ProASIC3E Flash Family FPGAs
Manufacturer
ACTEL [Actel Corporation]
Datasheet
1.A3PE1500-1FG896.pdf
(152 pages)
- Current page: 34 of 152
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ProASIC3E DC and Switching Characteristics
2 -2 2
Table 2-21 • I/O Short Currents I
The length of time an I/O can withstand I
reliability data below is based on a 3.3 V, 36 mA I/O setting, which is the worst case for this type of
analysis.
For example, at 110°C, the short current condition would have to be sustained for more than three
months to cause a reliability concern. The I/O design does not contain any short circuit protection,
but such protection would only be needed in extremely prolonged stress conditions.
Table 2-22 • Duration of Short Circuit Event before Failure
3.3 V LVTTL / 3.3 V LVCMOS
2.5 V LVCMOS
1.8 V LVCMOS
1.5 V LVCMOS
*
Temperature
–40°C
0°C
25°C
70°C
85°C
100°C
110°C
T
J
= 100°C
OSH
/I
OSL
v1.2
OSH
/I
Drive Strength
OSL
events depends on the junction temperature. The
12 mA
16 mA
24 mA
12 mA
16 mA
24 mA
12 mA
16 mA
12 mA
4 mA
8 mA
4 mA
8 mA
2 mA
4 mA
6 mA
8 mA
2 mA
4 mA
6 mA
8 mA
Time before Failure
> 20 years
> 20 years
> 20 years
6 months
3 months
5 years
2 years
I
OSH
103
132
268
169
25
51
16
32
65
83
17
35
45
91
91
13
25
32
66
66
(mA)*
9
I
OSL
109
127
181
124
27
54
18
37
74
87
11
22
44
51
74
74
16
33
39
55
55
(mA)*
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