LC4032B-10T44I LATTICE [Lattice Semiconductor], LC4032B-10T44I Datasheet - Page 37
LC4032B-10T44I
Manufacturer Part Number
LC4032B-10T44I
Description
3.3V/2.5V/1.8V In-System Programmable SuperFAST High Density PLDs
Manufacturer
LATTICE [Lattice Semiconductor]
Datasheet
1.LC4032B-10T44I.pdf
(74 pages)
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Lattice Semiconductor
Switching Test Conditions
Figure 12 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Table 11.
Figure 12. Output Test Load, LVTTL and LVCMOS Standards
Table 11. Test Fixture Required Components
LVCMOS I/O, (L -> H, H -> L)
LVCMOS I/O (Z -> H)
LVCMOS I/O (Z -> L)
LVCMOS I/O (H -> Z)
LVCMOS I/O (L -> Z)
1. C
L
includes test fixtures and probe capacitance.
Test Condition
DUT
106Ω 106Ω
106Ω
106Ω
R
∞
∞
1
106Ω
106Ω
R
∞
∞
2
V
R 1
R 2
37
CCO
35pF
35pF
35pF
5pF
5pF
C
L
ispMACH 4000V/B/C/Z Family Data Sheet
1
C L
LVCMOS 3.3 = 1.5V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
1.5V
1.5V
V
V
OH
OL
+ 0.3
- 0.3
0213A/ispm4k
Timing Ref.
Point
Test
CCO
CCO
/2
/2
LVCMOS 3.3 = 3.0V
LVCMOS 2.5 = 2.3V
LVCMOS 1.8 = 1.65V
3.0V
3.0V
3.0V
3.0V
V
CCO
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