EVAL-AD7324CB AD [Analog Devices], EVAL-AD7324CB Datasheet - Page 8

• Manufacturer Part Number: EVAL-AD7324CB
• Description: 4-Channel, Software-Selectable, True Bipolar Input, 12-Bit Plus Sign ADC
• Manufacturer: AD [Analog Devices]

AD7324
ABSOLUTE MAXIMUM RATINGS
T
Table 4.
Parameter
V
V
V
V
V
AGND to DGND
Analog Input Voltage to AGND
Digital Input Voltage to DGND
Digital Output Voltage to GND
REFIN to AGND
Input Current to Any Pin
Operating Temperature Range
Storage Temperature Range
Junction Temperature
TSSOP Package
Pb-Free Temperature, Soldering
ESD
1
2
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
If the analog inputs are being driven from alternative V
circuitry, Schottky diodes should be placed in series with the AD7324’s V
and V
Transient currents of up to 100 mA do not cause SCR latch-up.
DD
SS
DD
CC
DRIVE
A
Except Supplies
θ
θ
Reflow
= 25°C, unless otherwise noted
to AGND, DGND
to AGND, DGND
to AGND, DGND
to V
JA
JC
to AGND, DGND
Thermal Impedance
Thermal Impedance
SS
supplies.
CC
2
1
Rating
−0.3 V to +16.5 V
+0.3 V to −16.5 V
V
−0.3 V to +7 V
−0.3 V to + 7 V
−0.3 V to +0.3 V
V
−0.3 V to +7 V
−0.3 V to V
−0.3 V to V
±10 mA
−40°C to +85°C
−65°C to +150°C
150°C
150.4°C/W
27.6°C/W
260(0)°C
2.5 kV
CC
SS
−0.3 V to V
− 0.3 V to 16.5 V
DD
and V
DRIVE
CC
+ 0.3 V
DD
SS
+ 0.3 V
supply
+ 0.3 V
DD
Rev. 0 | Page 8 of 36
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.