74AUP1Z04GW-G NXP Semiconductors, 74AUP1Z04GW-G Datasheet - Page 19
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74AUP1Z04GW-G
Manufacturer Part Number
74AUP1Z04GW-G
Description
Buffers & Line Drivers 1.8V LOW-POW X-TAL DRVR ENABLE
Manufacturer
NXP Semiconductors
Datasheet
1.74AUP1Z04GW-G.pdf
(28 pages)
Specifications of 74AUP1Z04GW-G
Product Category
Buffers & Line Drivers
Rohs
yes
Mounting Style
SMD/SMT
Package / Case
SOT-363
Factory Pack Quantity
3000
Part # Aliases
74AUP1Z04GW,125
NXP Semiconductors
74AUP1Z04
Product data sheet
Fig 14. Crystal oscillator configuration for the 74AUP1Z04
13.1.2 Testing
After the calculations are performed for a particular crystal, the oscillator circuit should be
tested. The following simple checks will verify the prototype design of a crystal controlled
oscillator circuit. Perform them after laying out the board:
As the 74AUP1Z04 isolates the system loading, once the design is optimized, the single
layout may work in multiple applications for any given crystal.
•
•
•
•
Test the oscillator over worst-case conditions (lowest supply voltage, worst-case
crystal and highest operating temperature). Adding series and parallel resistors can
simulate a worst-case crystal.
Insure that the circuit does not oscillate without the crystal.
Check the frequency stability over a supply range greater than that which is likely to
occur during normal operation.
Check that the start-up time is within system requirements.
74AUP1GU04
X1
All information provided in this document is subject to legal disclaimers.
C 2
portion
R bias
Xtal
Rev. 5 — 9 August 2012
X2
R 1
C 1
74AUP1G04
portion
Low-power X-tal driver with enable and internal resistor
Y
system
load
C sys
001aai363
R sys
74AUP1Z04
© NXP B.V. 2012. All rights reserved.
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