CY7C1357C-133AXC Cypress Semiconductor Corp, CY7C1357C-133AXC Datasheet - Page 21
![IC SRAM 9MBIT 133MHZ 100LQFP](/photos/6/76/67624/428-100-tqfp_14x20x1_4_sml.jpg)
CY7C1357C-133AXC
Manufacturer Part Number
CY7C1357C-133AXC
Description
IC SRAM 9MBIT 133MHZ 100LQFP
Manufacturer
Cypress Semiconductor Corp
Type
Synchronousr
Datasheet
1.CY7C1355C-133AXC.pdf
(32 pages)
Specifications of CY7C1357C-133AXC
Memory Size
9M (512K x 18)
Package / Case
100-LQFP
Format - Memory
RAM
Memory Type
SRAM - Synchronous
Speed
133MHz
Interface
Parallel
Voltage - Supply
3.135 V ~ 3.6 V
Operating Temperature
0°C ~ 70°C
Access Time
6.5 ns
Maximum Clock Frequency
133 MHz
Supply Voltage (max)
3.6 V
Supply Voltage (min)
3.135 V
Maximum Operating Current
250 mA
Maximum Operating Temperature
+ 70 C
Minimum Operating Temperature
0 C
Mounting Style
SMD/SMT
Number Of Ports
2
Operating Supply Voltage
3.3 V
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
428-2123
CY7C1357C-133AXC
CY7C1357C-133AXC
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
CY7C1357C-133AXC
Manufacturer:
Cypress Semiconductor Corp
Quantity:
135
Company:
Part Number:
CY7C1357C-133AXC
Manufacturer:
Cypress Semiconductor Corp
Quantity:
10 000
Company:
Part Number:
CY7C1357C-133AXCT
Manufacturer:
Cypress Semiconductor Corp
Quantity:
10 000
Capacitance
Thermal Resistance
AC Test Loads and Waveforms
Note
Document Number: 38-05539 Rev. *H
C
C
C
Θ
Θ
15. Tested initially and after any design or process change that may affect these parameters.
3.3 V I/O Test Load
2.5 V I/O Test Load
IN
CLK
I/O
JA
JC
OUTPUT
OUTPUT
Parameter
Parameter
Z
Z
0
0
[15]
= 50 Ω
= 50 Ω
Thermal resistance
(junction to ambient)
Thermal resistance
(junction to case)
Input capacitance
Clock input capacitance
Input/output capacitance
(a)
(a)
V
V
T
Description
Description
T
= 1.25 V
[15]
= 1.5 V
R
R
L
L
= 50 Ω
= 50 Ω
OUTPUT
OUTPUT
3.3 V
2.5 V
INCLUDING
INCLUDING
JIG AND
SCOPE
Test conditions follow
standard test methods and
procedures for measuring
thermal impedance, per
EIA/JESD51.
JIG AND
SCOPE
T
5 pF
5 pF
A
Test Conditions
Test Conditions
= 25 °C, f = 1 MHz,
V
V
DDQ
DD
(b)
(b)
= 3.3 V.
R = 317 Ω
R = 1667 Ω
= 2.5 V
R = 351 Ω
R = 1538 Ω
V
100 TQFP
100 TQFP
Package
GND
GND
V
DDQ
DDQ
29.41
Max
6.31
≤ 1 ns
≤ 1 ns
5
5
5
10%
10%
CY7C1355C, CY7C1357C
119 BGA
119 BGA
Package
ALL INPUT PULSES
ALL INPUT PULSES
Max
34.1
14.0
5
5
7
90%
90%
(c)
(c)
165 FBGA
165 FBGA
Package
Max
16.8
3.0
5
5
7
90%
90%
10%
10%
Page 21 of 32
°C/W
°C/W
Unit
Unit
≤ 1 ns
≤ 1 ns
pF
pF
pF
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