CY7C131-55NXC Cypress Semiconductor Corp, CY7C131-55NXC Datasheet - Page 9

IC SRAM 8KBIT 55NS 52-QFP

CY7C131-55NXC

Manufacturer Part Number
CY7C131-55NXC
Description
IC SRAM 8KBIT 55NS 52-QFP
Manufacturer
Cypress Semiconductor Corp
Type
Asynchronousr
Datasheets

Specifications of CY7C131-55NXC

Memory Size
8K (1K x 8)
Package / Case
52-QFP
Format - Memory
RAM
Memory Type
SRAM - Dual Port, Asynchronous
Speed
55ns
Interface
Parallel
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
0°C ~ 70°C
Access Time
55 ns
Supply Voltage (max)
5.5 V
Supply Voltage (min)
4.5 V
Maximum Operating Current
110 mA
Maximum Operating Temperature
+ 70 C
Minimum Operating Temperature
0 C
Mounting Style
SMD/SMT
Number Of Ports
2
Operating Supply Voltage
5 V
Rohs Compliant
YES
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
428-2111
CY7C131-55NXC

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
CY7C131-55NXC
Manufacturer:
Cypress Semiconductor Corp
Quantity:
10 000
Part Number:
CY7C131-55NXCT
Manufacturer:
Cypress Semiconductor Corp
Quantity:
10 000
Switching Characteristics
Over the Operating Range
Document Number: 38-06002 Rev. *G
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
Notes
RC
AA
OHA
ACE
DOE
LZOE
HZOE
LZCE
HZCE
PU
PD
WC
SCE
AW
HA
SA
PWE
SD
HD
HZWE
LZWE
23. See the last page of this specification for Group A subgroup testing information.
24. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to 3.0 V and output loading of the specified
25. AC Test Conditions use V
26. This parameter is guaranteed but not tested.
27. At any given temperature and voltage condition for any given device, t
28. t
29. The internal write time of the memory is defined by the overlap of CS LOW and R/W LOW. Both signals must be low to initiate a write and either signal can
Read Cycle
Write Cycle
Parameter
I
terminate a write by going high. The data input setup and hold timing should be referenced to the rising edge of the signal that terminates the write.
OL
LZCE
/I
OH,
, t
LZWE
and 30 pF load capacitance.
, t
[29]
HZOE
Read cycle time
Address to data valid
Data hold from address change
CE LOW to data valid
OE LOW to data valid
OE LOW to low Z
OE HIGH to high Z
CE LOW to low Z
CE HIGH to high Z
CE LOW to power-up
CE HIGH to power-down
Write cycle time
CE LOW to write end
Address set-up to write end
Address hold from write end
Address set-up to write start
R/W pulse width
Data set-up to write end
Data hold from write end
R/W LOW to high Z
R/W HIGH to low Z
, t
LZOE
, t
OH
HZCE
[23, 24]
= 1.6 V and V
and t
HZWE
[26, 27, 28]
[26, 27, 28]
Description
[28]
[28]
[26, 27, 28]
[26, 27, 28]
[25]
[26]
OL
[25]
[25]
are tested with C
= 1.4 V.
[26]
L
= 5 pF as in part (b) of AC Test Loads. Transition is measured ±500 mV from steady state voltage.
HZCE
is less than t
Min
35
35
30
30
25
15
0
3
5
0
2
0
0
0
7C130-35
7C131-35
7C140-35
7C141-35
LZCE
Max
and t
35
35
20
20
20
35
20
HZOE
is less than t
Min
45
45
35
35
30
20
7C130-45
7C131-45
7C140-45
7C141-45
0
3
5
0
2
0
0
0
LZOE
Max
45
45
25
20
20
35
20
CY7C130, CY7C130A
CY7C131, CY7C131A
.
Min
55
55
40
40
30
20
7C130-55
7C131-55
7C140-55
7C141-55
0
3
5
0
2
0
0
0
Max
55
55
25
25
25
35
25
Page 9 of 22
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
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