CAT28F010G12 ON Semiconductor, CAT28F010G12 Datasheet - Page 3

• Manufacturer Part Number: CAT28F010G12
• Description: IC FLASH 1MBIT 120NS 32PLCC
• Manufacturer: ON Semiconductor

Specifications of CAT28F010G12

• Format - Memory: FLASH
• Memory Type: FLASH
• Memory Size: 1M (128K x 8)
• Speed: 120ns
• Interface: Parallel
• Voltage - Supply: 4.5 V ~ 5.5 V
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 32-PLCC
• Density: 1Mb
• Access Time (max): 120ns
• Interface Type: Parallel
• Boot Type: Not Required
• Address Bus: 17b
• Operating Supply Voltage (typ): 5V
• Operating Temp Range: 0C to 70C
• Package Type: PLCC
• Program/erase Volt (typ): 11.4 to 12.6V
• Sync/async: Asynchronous
• Operating Temperature Classification: Commercial
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Word Size: 8b
• Number Of Words: 128K
• Supply Current: 30mA
• Mounting: Surface Mount
• Pin Count: 32
• Data Bus Width: 8 bit
• Architecture: Non Sectored
• Supply Voltage (max): 5.5 V
• Supply Voltage (min): 4.5 V
• Maximum Operating Current: 30 mA
• Mounting Style: SMD/SMT
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: CAT28F010G-12; CAT28F010G-12

RELIABILITY CHARACTERISTICS
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias .................. -45 C to +130 C
Storage Temperature ........................ -65 C to +150 C
Voltage on Any Pin with
Voltage on Pin A
V
V
Package Power Dissipation
Lead Soldering Temperature (10 secs) ............ 300 C
Output Short Circuit Current
CAPACITANCE T
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
© 2009 SCILLC. All rights reserved.
Characteristics subject to change without notice
PP
CC
N
T
V
I
LTH
Symbol
Symbol
C
C
C
DR
ZAP
voltage on output pins is V
Respect to Ground
Respect to Ground
during Program/Erase
Capability (T
END
with Respect to Ground
with Respect to Ground
IN
OUT
VPP
(3)
(3)(4)
(3)
(3)
(3)
(3)
(3)
Endurance
Data Retention
ESD Susceptibility
Latch-Up
A
9
= 25 C) .................................. 1.0 W
with
A
Input Pin Capacitance
Output Pin Capacitance
V
Parameter
= 25 C, f = 1.0 MHz
PP
(1)
(1)
Supply Capacitance
CC
............ -2.0V to +V
.................... -2.0V to +13.5V
(1)
+0.5V, which may overshoot to V
............... -2.0V to +14.0V
(1)
(2)
Test
............. -2.0V to +7.0V
........................ 100 mA
100K
2000
Min
100
10
CC
+ 2.0V
Max
CC
Min
+ 2.0V for periods of less than 20ns.
3
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.
Limits
Cycles/Byte
Units
Years
Volts
mA
Max.
10
25
6
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
CC
Units
pF
pF
pF
+1V.
Test Method
Conditions
V
V
V
Doc. No. MD-1019, Rev. G
IN
OUT
PP
CAT28F010
= 0V
= 0V
= 0V