CY7C1339G-133AXET Cypress Semiconductor Corp, CY7C1339G-133AXET Datasheet - Page 10

IC SRAM 4MBIT 133MHZ 100LQFP

CY7C1339G-133AXET

Manufacturer Part Number
CY7C1339G-133AXET
Description
IC SRAM 4MBIT 133MHZ 100LQFP
Manufacturer
Cypress Semiconductor Corp
Datasheet

Specifications of CY7C1339G-133AXET

Format - Memory
RAM
Memory Type
SRAM - Synchronous
Memory Size
4M (128K x 32)
Speed
133MHz
Interface
Parallel
Voltage - Supply
3.15 V ~ 3.6 V
Operating Temperature
-40°C ~ 125°C
Package / Case
100-LQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
CY7C1339G-133AXET
Manufacturer:
Cypress Semiconductor Corp
Quantity:
10 000
Document #: 38-05520 Rev. *F
Switching Characteristics
t
Clock
t
t
t
Output Times
t
t
t
t
t
t
t
Set-up Times
t
t
t
t
t
t
Hold Times
t
t
t
t
t
t
Notes:
12. This part has a voltage regulator internally; t
13. t
14. At any given voltage and temperature, t
15. This parameter is sampled and not 100% tested.
16. Timing reference level is 1.5V when V
17. Test conditions shown in (a) of AC Test Loads unless otherwise noted.
POWER
CYC
CH
CL
CO
DOH
CLZ
CHZ
OEV
OELZ
OEHZ
AS
ADS
ADVS
WES
DS
CES
AH
ADH
ADVH
WEH
DH
CEH
Parameter
can be initiated.
data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed
to achieve High-Z prior to Low-Z under the same system conditions.
CHZ
, t
CLZ
,t
OELZ
, and t
V
Clock Cycle Time
Clock HIGH
Clock LOW
Data Output Valid After CLK Rise
Data Output Hold After CLK Rise
Clock to Low-Z
Clock to High-Z
OE LOW to Output Valid
OE LOW to Output Low-Z
OE HIGH to Output High-Z
Address Set-up Before CLK Rise
ADSC, ADSP Set-up Before CLK Rise
ADV Set-up Before CLK Rise
GW, BWE, BW
Data Input Set-up Before CLK Rise
Chip Enable Set-Up Before CLK Rise
Address Hold After CLK Rise
ADSP, ADSC Hold After CLK Rise
ADV Hold After CLK Rise
GW, BWE, BW
Data Input Hold After CLK Rise
Chip Enable Hold After CLK Rise
DD
OEHZ
(Typical) to the first Access
are specified with AC test conditions shown in part (b) of AC Test Loads. Transition is measured ± 200 mV from steady-state voltage.
DDQ
[13, 14, 15]
X
X
Description
[13, 14, 15]
OEHZ
Over the Operating Range
Set-up Before CLK Rise
Hold After CLK Rise
= 3.3V and is 1.25V when V
POWER
is less than t
is the time that the power needs to be supplied above V
[13, 14, 15]
[13, 14, 15]
OELZ
[12]
and t
CHZ
DDQ
is less than t
[12, 13, 14, 15, 16, 17]
= 2.5V.
Min.
4.0
1.7
1.7
1.0
1.2
1.2
1.2
1.2
1.2
1.2
0.3
0.3
0.3
0.3
0.3
0.3
1
0
0
–250
CLZ
Max.
2.6
2.6
2.6
2.6
to eliminate bus contention between SRAMs when sharing the same
Min.
5.0
2.0
2.0
1.0
1.2
1.2
1.2
1.2
1.2
1.2
0.5
0.5
0.5
0.5
0.5
0.5
1
0
0
–200
Max.
DD
2.8
2.8
2.8
2.8
(minimum) initially before a read or write operation
Min.
1.5
1.5
1.5
1.5
0.5
0.5
0.5
6.0
2.5
2.5
1.5
1.5
1.5
0.5
0.5
0.5
1
0
0
–166
Max. Min. Max.
3.5
3.5
3.5
3.5
CY7C1339G
7.5
3.0
3.0
1.5
1.5
1.5
1.5
1.5
1.5
1.5
0.5
0.5
0.5
0.5
0.5
0.5
1
0
0
–133
Page 10 of 18
4.0
4.0
4.0
4.0
Unit
ms
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
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