DEMO9S08LG32 Freescale Semiconductor, DEMO9S08LG32 Datasheet - Page 10

DEMO BOARD FOR LG32 FAMILY MCU

DEMO9S08LG32

Manufacturer Part Number
DEMO9S08LG32
Description
DEMO BOARD FOR LG32 FAMILY MCU
Manufacturer
Freescale Semiconductor
Type
MCUr

Specifications of DEMO9S08LG32

Contents
Board, CD
Processor To Be Evaluated
MC9S08LG32x
Data Bus Width
8 bit
Interface Type
USB
Maximum Operating Temperature
+ 85 C
Minimum Operating Temperature
- 40 C
Silicon Manufacturer
Freescale
Core Architecture
HCS08
Core Sub-architecture
HCS08
Silicon Core Number
MC9S08
Silicon Family Name
S08LG
Rohs Compliant
Yes
For Use With/related Products
MC9S08LG32
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Electrical Characteristics
2
2.1
This section contains electrical and timing specifications for the MC9S08LG32 series of microcontrollers available at the time
of publication.
2.2
The electrical parameters shown in this supplement are guaranteed by various methods. To give the customer a better
understanding the following classification is used and the parameters are tagged accordingly in the tables where appropriate:
2.3
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not guaranteed. Stress beyond the
limits specified in
conditions, refer to the remaining tables in this section.
This device contains circuitry that protects against damage due to high static voltage or electrical fields. However, it is advised
that normal precautions should be taken to avoid application of any voltages higher than maximum-rated voltages to this
high-impedance circuit. Reliability of operation is enhanced if unused inputs are tied to an appropriate logic voltage level (for
instance, either V
10
80
77
78
79
80
P
C
D
T
Packages
Electrical Characteristics
Introduction
Parameter Classification
Absolute Maximum Ratings
64
61
62
63
64
Those parameters are guaranteed during production testing on each individual device.
Those parameters are achieved by the design characterization by measuring a statistically relevant
sample size across process variations.
Those parameters are achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted. All values shown in the typical column are within this
category.
Those parameters are derived mainly from simulations.
SS
The classification is shown in the column labeled “C” in the parameter tables where
appropriate.
Table 4
or V
DD
may affect device reliability or cause permanent damage to the device. For functional operating
48
45
46
47
48
) or the programmable pull-up resistor associated with the pin is enabled.
Table 2. Pin Availability by Package Pin-Count (continued)
Port Pin
PTE3
PTE2
PTE1
PTE0
MC9S08LG32 Series Data Sheet, Rev. 7
Table 3. Parameter Classifications
LCD11
LCD10
LCD9
LCD8
Alt 1
NOTE
<-- Lowest
Priority
Alt 2
--> Highest
Alt 3
Freescale Semiconductor
Alt 4

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