CS5376A-IQZ Cirrus Logic Inc, CS5376A-IQZ Datasheet - Page 65

• Manufacturer Part Number: CS5376A-IQZ
• Description: IC,Digital Filter,QFP,64PIN,PLASTIC
• Manufacturer: Cirrus Logic Inc

Specifications of CS5376A-IQZ

• Filter Type: Digital
• Number Of Filters: 4
• Max-order: 2nd
• Voltage - Supply: 3 V ~ 5 V
• Mounting Type: Surface Mount
• Package / Case: 64-TQFP, 64-VQFP
• Package: 64TQFP
• Operating Temperature: -40 to 85 °C
• Resolution (bits): 24bit
• Conversion Rate: 4kSPS
• Operating Temperature Range: -40°C To +85°C
• No. Of Pins: 64
• Msl: MSL 3 - 168 Hours
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• For Use With: 598-1778 - EVALUATION BOARD FOR CS5376
• Frequency - Cutoff Or Center: -
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Loopback - LOOP
Enables digital loopback from the TBS output to
the MDATA inputs.
Run - RUN
Enables the test bit stream generator.
Data Delay - DDLY[5:0]
Programs full period delays for TBSDATA, up to a
maximum of 63 bits.
Gain - TBSGAIN[23:0]
Scales the amplitude of the sine wave output. Max-
imum 0x04FFFF, nominal 0x04B8F2.
17.4 TBS Data Source
Data to create test signals is loaded into digital fil-
ter memory by configuration commands. The on-
chip sine wave data is suitable for most tests,
DS612F4
Test Bit Stream Characteristic Equation:
(Signal Freq) * (# TBS Data) * (Interpolation + 1) = Output Rate
Example: (31.25 Hz) * (1024) * (0x07 + 1) = 256 kHz
(TBSDATA)
Frequency
125.00 Hz
125.00 Hz
10.00 Hz
10.00 Hz
25.00 Hz
25.00 Hz
31.25 Hz
31.25 Hz
50.00 Hz
50.00 Hz
Signal
Table 19. TBS Configurations Using On-chip Data
(TBSCLK)
256 kHz
512 kHz
256 kHz
512 kHz
256 kHz
512 kHz
256 kHz
512 kHz
256 kHz
512 kHz
Output
Rate
though custom data is required to support custom
signal frequencies. See “EEPROM Configuration
Commands” on page 28 or “Microcontroller Con-
figuration Commands” on page 35 for information
about programming TBS data.
TBS ROM Data
An on-chip 24-bit 1024 point digital sine wave is
stored on the CS5376A. When selected by the
‘Write TBS ROM Data’ configuration command,
the TBS generator can produce the test signal fre-
quencies listed in Table 19. Additional discrete test
frequencies and output rates can be programmed
with the on-chip data by varying the interpolation
factor and output rate.
Custom TBS Data
If a required test frequency cannot be generated us-
ing the on-chip test bit stream data, a custom data
Output Rate
Selection
(RATE)
0x4
0x5
0x4
0x5
0x4
0x5
0x4
0x5
0x4
0x5
Interpolation
Selection
(INTP)
0x0F
0x18
0x31
0x09
0x13
0x07
0x04
0x09
0x01
0x03
CS5376A
65