PEB24911HV13 Lantiq, PEB24911HV13 Datasheet - Page 115

• Manufacturer Part Number: PEB24911HV13
• Manufacturer: Lantiq

Specifications of PEB24911HV13

• Lead Free Status / Rohs Status: Supplier Unconfirmed

4.4.4.7
– Return loss is defined in ANSI T1.601 and ETSI TS 102 080
– DFE-Q V2.1 is in RESET state (C/I = ’RES’ or Pin RES= ’0’)
– Measure complex impedance “Z” from 1 kHz – 200 kHz
– Calculate return loss with formula:
4.4.4.8
– Quite mode is defined in ANSI T1.601 and ETSI TS 102 080
– DFE-Q V2.1 is in the “Reset” state (C/I = ’RES’ or Pin RES= ’0’)
– Trigger and exit criteria have to be realized externally
4.4.4.9
– Insertion loss is defined in ANSI T1.601 and ETSI TS 102 080
– DFE-Q V2.1 is in Data Through test mode (C/I = ’DT’ or Pin DT= ’1’)
– Trigger and exit criteria have to be realized externally
4.4.5
The DFE-Q V2.1 provides a boundary scan support for a cost effective board testing. It
consists of:
• Boundary scan according to IEEE 1149.1 specification
• Test Access Port controller (TAP)
• Five dedicated pins (TCK, TMS, TDI, TDO, TRST)
• Pins TRST, TDI and TMS are provided with an internal pullup resistor
• One 32-bit IDCODE register
• Pin TRST tied to low resets the Boundary Scan TAP Controller
• Instructions CLAMP and HIGHZ were added, instructions SSP and DT were removed
Data Sheet
RL(dB) = 20log (abs((Z + 135) / (Z –135)))
(recommended setting for normal operation if the Boundary Scan logic is not used)
in V2.1
Return-Loss Measurement
Quiet Mode Measurement
Insertion Loss Measurement
Boundary Scan
105
Operational Description
PEF 24911
2001-07-16