CY7C1512JV18-267BZI Cypress Semiconductor Corp, CY7C1512JV18-267BZI Datasheet - Page 16

• Manufacturer Part Number: CY7C1512JV18-267BZI
• Description: IC SRAM 72MBIT 267MHZ 165TFBGA
• Manufacturer: Cypress Semiconductor Corp

Specifications of CY7C1512JV18-267BZI

• Format - Memory: RAM
• Memory Type: SRAM - Synchronous, QDR II
• Memory Size: 72M (4M x 18)
• Speed: 267MHz
• Interface: Parallel
• Voltage - Supply: 1.7 V ~ 1.9 V
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 165-TFBGA
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

TAP AC Switching Characteristics
Over the Operating Range
TAP Timing and Test Conditions
Figure 2
Notes
Document #: 001-14435 Rev. *G
t
t
t
t
Setup Times
t
t
t
Hold Times
t
t
t
Output Times
t
t
13. t
14. Test conditions are specified using the load in TAP AC Test Conditions. t
TCYC
TF
TH
TL
TMSS
TDIS
CS
TMSH
TDIH
CH
TDOV
TDOX
Parameter
CS
and t
shows the TAP timing and test conditions.
CH
refer to the setup and hold time requirements of latching data from the boundary scan register.
TCK Clock Cycle Time
TCK Clock Frequency
TCK Clock HIGH
TCK Clock LOW
TMS Setup to TCK Clock Rise
TDI Setup to TCK Clock Rise
Capture Setup to TCK Rise
TMS Hold after TCK Clock Rise
TDI Hold after Clock Rise
Capture Hold after Clock Rise
TCK Clock LOW to TDO Valid
TCK Clock LOW to TDO Invalid
TDO
Test Mode Select
TMS
Test Clock
TCK
Test Data In
TDI
Test Data Out
TDO
[13, 14]
Z
0
= 50Ω
(a)
GND
0.9V
Figure 2. TAP Timing and Test Conditions
C
50Ω
L
= 20 pF
Description
[14]
t
TMSS
t
TDIS
R
/t
F
= 1 ns.
t
t
TDOV
TH
0V
t
t
TL
TMSH
t
TDIH
1.8V
t
ALL INPUT PULSES
TDOX
0.9V
t
TCYC
Min
50
20
20
5
5
5
5
5
5
0
CY7C1525JV18
CY7C1512JV18
CY7C1514JV18
Max
20
10
Page 16 of 26
MHz
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
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