STK12C68-SF45I Cypress Semiconductor Corp, STK12C68-SF45I Datasheet - Page 9

IC NVSRAM 64KBIT 45NS 28SOIC

STK12C68-SF45I

Manufacturer Part Number
STK12C68-SF45I
Description
IC NVSRAM 64KBIT 45NS 28SOIC
Manufacturer
Cypress Semiconductor Corp
Series
-r
Datasheets

Specifications of STK12C68-SF45I

Memory Size
64K (8K x 8)
Package / Case
28-SOIC (8.69mm width)
Format - Memory
RAM
Memory Type
NVSRAM (Non-Volatile SRAM)
Speed
45ns
Interface
Parallel
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
-40°C ~ 85°C
Access Time
45 ns
Supply Voltage (max)
7 V
Supply Voltage (min)
4.5 V
Maximum Operating Current
65 mA
Organization
8 K x 8
Maximum Operating Temperature
+ 85 C
Minimum Operating Temperature
- 40 C
Mounting Style
SMD/SMT
Operating Supply Voltage
4.5 V to 5.5 V
Rohs Compliant
YES
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Contains lead / RoHS non-compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
STK12C68-SF45I
Manufacturer:
Simtek
Quantity:
500
Part Number:
STK12C68-SF45I
Manufacturer:
SIMTEK
Quantity:
20 000
Part Number:
STK12C68-SF45ITR
Manufacturer:
CADDOCK
Quantity:
101
Data Retention and Endurance
Capacitance
In the following table, the capacitance parameters are listed.
Thermal Resistance
In the following table, the thermal resistance parameters are listed.
AC Test Conditions
Input Pulse Levels .................................................. 0 V to 3 V
Input Rise and Fall Times (10% to 90%) ...................... <5 ns
Input and Output Timing Reference Levels .......................1.5
Note
Document Number: 001-51027 Rev. *D
DATA
NV
C
C
Parameter
6. These parameters are guaranteed by design and are not tested.
Parameter
Parameter
IN
OUT
C
Θ
Θ
Output
R
JC
JA
5.0V
Thermal Resis-
tance
(Junction to
Ambient)
Thermal Resis-
tance
(Junction to Case)
Input Capacitance
Output Capacitance
Data Retention
Nonvolatile STORE Operations
Description
Description
30 pF
Description
Test conditions follow
standard test methods and
procedures for measuring
thermal impedance, per EIA /
JESD51.
R1 963Ω
T
V
Test Conditions
A
CC
= 25°C, f = 1 MHz,
= 0 to 3.0 V
Figure 6. AC Test Loads
512Ω
R2
[6]
Test Conditions
28-SOIC
[6]
46.55
27.95
Output
5.0V
(300 mil)
28-PDIP
45.16
31.62
1,000
5 pF
Min
100
(600 mil)
28-PDIP
55.84
25.74
R1 963Ω
28-CDIP
46.1
5.01
For Tri-state Specs
Max
8
7
512Ω
28-LCC
STK12C68
R2
95.31
9.01
Page 9 of 23
Years
Unit
K
Unit
pF
pF
°C/W
°C/W
Unit
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