MAX16070ETL+ Maxim Integrated Products, MAX16070ETL+ Datasheet - Page 38

• Manufacturer Part Number: MAX16070ETL+
• Description: IC SYSTEM MANAGER 12CH 40-TQFN
• Manufacturer: Maxim Integrated Products

Specifications of MAX16070ETL+

• Applications: Power Supply Monitor
• Voltage - Supply: 2.8 V ~ 14 V
• Current - Supply: 4.5mA
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 40-VQFN Exposed Pad, 40-HVQFN, 40-SQFN, 40-DHVQFN
• Product: Current Monitors
• Operating Temperature Range: - 40 C to + 85 C
• Mounting Style: SMD/SMT
• Accuracy: 2.5 %
• Sense Voltage (max): 14 V
• Supply Current (max): 14 mA
• Supply Voltage (max): 14 V
• Supply Voltage (min): 2.8 V
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Voltage - Input: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

12-Channel/8-Channel, Flash-Configurable System
Managers with Nonvolatile Fault Registers
Figure
The TAP controller is a finite state machine that responds
to the logic level at TMS on the rising edge of TCK. See
Figure 13 for a diagram of the finite state machine. The
possible states are described in the following:
Test-Logic-Reset: At power-up, the TAP controller
is in the test-logic-reset state. The instruction register
contains the IDCODE instruction. All system logic of the
device operates normally. This state can be reached
from any state by driving TMS high for five clock cycles.
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12. JTAG Block Diagram
TMS
TCK
TDI
R
PU
V
DB
Test Access Port (TAP)
Controller State Machine
MEMORY ADDRESS REGISTER
MEMORY WRITE REGISTER
MEMORY READ REGISTER
IDENTIFICATION REGISTER
INSTRUCTION REGISTER
USER CODE REGISTER
TEST ACCESS PORT
[LENGTH = 5 BITS]
(TAP) CONTROLLER
[LENGTH = 32 BITS]
[LENGTH = 32 BITS]
[LENGTH = 8 BITS]
[LENGTH = 8 BITS]
[LENGTH = 8 BITS]
BYPASS REGISTER
[LENGTH = 1 BIT]
AND FLASH
REGISTERS
Run-Test/Idle: The run-test/idle state is used between
scan operations or during specific tests. The instruction
register and test data registers remain idle.
Select-DR-Scan: All test data registers retain their previ-
ous state. With TMS low, a rising edge of TCK moves the
controller into the capture-DR state and initiates a scan
sequence. TMS high during a rising edge on TCK moves
the controller to the select-IR-scan state.
Capture-DR: Data can be parallel-loaded into the test
data registers selected by the current instruction. If the
instruction does not call for a parallel load or the selected
test data register does not allow parallel loads, the test
01100
01011
01010
01001
01000
00111
00110
00101
00100
00011
00000
11111
MUX 1
COMMAND
DECODER
MUX 2
01001
01010
01011
01100
01000
00111
SETFLSHADD
RSTFLSHADD
SETUSRFLSH
RSTUSRFLSH
SAVE
REBOOT
TDO