AT91SAM7X512-AU-999 Atmel, AT91SAM7X512-AU-999 Datasheet - Page 45
AT91SAM7X512-AU-999
Manufacturer Part Number
AT91SAM7X512-AU-999
Description
IC MCU ARM 512K HS FLASH 100LQFP
Manufacturer
Atmel
Series
AT91SAMr
Datasheet
1.AT91SAM7X512-AU-999.pdf
(687 pages)
Specifications of AT91SAM7X512-AU-999
Core Processor
ARM7
Core Size
16/32-Bit
Speed
55MHz
Connectivity
CAN, Ethernet, I²C, SPI, SSC, UART/USART, USB
Peripherals
Brown-out Detect/Reset, DMA, POR, PWM, WDT
Number Of I /o
62
Program Memory Size
512KB (512K x 8)
Program Memory Type
FLASH
Ram Size
128K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 1.95 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
100-LQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
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12. Debug and Test Features
12.1
12.2
6120H–ATARM–17-Feb-09
Description
Block Diagram
The AT91SAM7X Series features a number of complementary debug and test capabilities. A
common JTAG/ICE (In-Circuit Emulator) port is used for standard debugging functions, such as
downloading code and single-stepping through programs. The Debug Unit provides a two-pin
UART that can be used to upload an application into internal SRAM. It manages the interrupt
handling of the internal COMMTX and COMMRX signals that trace the activity of the Debug
Communication Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from
a PC-based test environment.
Figure 12-1. Debug and Test Block Diagram
PDC
Boundary
ARM7TDMI
TAP
DBGU
ICE
AT91SAM7X512/256/128 Preliminary
ICE/JTAG
TAP
Reset
and
Test
POR
TMS
TCK
TDI
JTAGSEL
TDO
DTXD
DRXD
TST
45
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