P80C32X2FN,112 NXP Semiconductors, P80C32X2FN,112 Datasheet - Page 39

IC 80C51 MCU 256 ROMLESS 40DIP

P80C32X2FN,112

Manufacturer Part Number
P80C32X2FN,112
Description
IC 80C51 MCU 256 ROMLESS 40DIP
Manufacturer
NXP Semiconductors
Series
80Cr
Datasheet

Specifications of P80C32X2FN,112

Core Processor
8051
Core Size
8-Bit
Speed
33MHz
Connectivity
EBI/EMI, UART/USART
Peripherals
POR
Number Of I /o
32
Program Memory Type
ROMless
Ram Size
256 x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
40-DIP (0.600", 15.24mm)
Cpu Family
80C
Device Core
80C51
Device Core Size
8b
Frequency (max)
33MHz
Interface Type
UART
Program Memory Size
Not Required
Total Internal Ram Size
256Byte
# I/os (max)
32
Number Of Timers - General Purpose
3
Operating Supply Voltage (typ)
5V
Operating Supply Voltage (max)
5.5V
Operating Supply Voltage (min)
4.5V
Instruction Set Architecture
CISC
Operating Temp Range
-40C to 85C
Operating Temperature Classification
Industrial
Mounting
Through Hole
Pin Count
40
Package Type
PDIP
Processor Series
P80C3x
Core
80C51
Data Bus Width
8 bit
Data Ram Size
256 B
Maximum Clock Frequency
33 MHz
Number Of Programmable I/os
32
Number Of Timers
3
Operating Supply Voltage
2.7 V to 5.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
Through Hole
3rd Party Development Tools
PK51, CA51, A51, ULINK2
Minimum Operating Temperature
- 40 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Program Memory Size
-
Data Converters
-
Lead Free Status / Rohs Status
Compliant
Other names
935269611112
P80C32X2FN
P80C32X2FN

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
P80C32X2FN,112
Manufacturer:
HONGFA
Quantity:
16 000
Philips Semiconductors
DC ELECTRICAL CHARACTERISTICS
T
NOTES:
1. Typical ratings are not guaranteed. The values listed are at room temperature, 5 V.
2. Capacitive loading on ports 0 and 2 may cause spurious noise to be superimposed on the V
3. Capacitive loading on ports 0 and 2 may cause the V
4. Pins of ports 1, 2 and 3 source a transition current when they are being externally driven from 1 to 0. The transition current reaches its
5. See Figures 36 through 39 for I
6. This value applies to T
7. Load capacitance for port 0, ALE, and PSEN = 100 pF, load capacitance for all other outputs = 80 pF.
8. Under steady state (non-transient) conditions, I
9. ALE is tested to V
10. Pin capacitance is characterized but not tested. Pin capacitance is less than 25 pF. Pin capacitance of ceramic package is less than 15 pF
11. To improve noise rejection a nominal 100 ns glitch rejection circuitry has been added to the RST pin, and a nominal 15 ns glitch rejection
2003 Jan 24
amb
SYMBOL PARAMETER
V
V
V
V
V
V
V
I
I
I
I
V
R
C
IL
TL
LI
CC
IL
IH
IH1
OL
OL1
OH
OH1
RAM
80C51 8-bit microcontroller family
4K/8K/16K/32K ROM/OTP, low voltage (2.7 to 5.5 V),
low power, high speed (30/33 MHz)
RST
IO
to external bus capacitance discharging into the port 0 and port 2 pins when these pins make 1-to-0 transitions during bus operations. In the
worst cases (capacitive loading > 100 pF), the noise pulse on the ALE pin may exceed 0.8 V. In such cases, it may be desirable to qualify
ALE with a Schmitt Trigger, or use an address latch with a Schmitt Trigger STROBE input. I
single output sinks more than 5 mA and no more than two outputs exceed the test conditions.
address bits are stabilizing.
maximum value when V
12-clock mode characteristics:
If I
test conditions.
(except EA is 25 pF).
circuitry has been added to the INT0 and INT1 pins. Previous devices provided only an inherent 5 ns of glitch rejection.
= 0 C to +70 C or –40 C to +85 C; V
OL
Active mode (operating):
Active mode (reset):
Idle mode:
Maximum I
Maximum I
Maximum total I
exceeds the test condition, V
Input low voltage
Input high voltage (ports 0, 1, 2, 3, EA)
Input high voltage, XTAL1, RST
Output low voltage, ports 1, 2, 3
Output low voltage, port 0, ALE, PSEN
Output high voltage, ports 1, 2, 3
Output high voltage (port 0 in external bus
mode), ALE
Logical 0 input current, ports 1, 2, 3
Logical 1-to-0 transition current, ports 1, 2, 3
Input leakage current, port 0
Power supply current (see Figure 34):
Active mode (see Note 5)
Idle mode (see Note 5)
Power-down mode or clock stopped
(see Figure 39 for conditions)
RAM keep-alive voltage
Internal reset pull-down resistor
Pin capacitance
OL
OL
per port pin:
per 8-bit port:
OH1
OL
9
, except when ALE is off then V
amb
for all outputs:
, PSEN
IN
10
is approximately 2 V.
11
= 0 C to +70 C. For T
(except EA)
3
I
I
I
CC(MAX)
CC(MAX)
CC(MAX)
CC
test conditions and Figure 34 for I
OL
may exceed the related specification. Pins are not guaranteed to sink current greater than the listed
= 1.0 mA + 0.9 mA
= 7.0 mA + 0.5 mA x FREQ.[MHz]
= 1.0 mA + 0.18 mA
15 mA (*NOTE: This is 85 C specification.)
26 mA
71 mA
11
CC
8
3
= 5 V 10%; V
OL
amb
7, 8
must be externally limited as follows:
= –40 C to +85 C, I
OH
OH
6
on ALE and PSEN to momentarily fall below the V
is the voltage specification.
TEST
CONDITIONS
4.5 V < V
V
V
V
V
V
V
0.45 < V
T
T
amb
amb
CC
CC
CC
CC
IN
IN
SS
FREQ.[MHz]
= 0.4 V
= 2.0 V; See note 4
= 4.5 V; I
= 4.5 V; I
= 4.5 V; I
= 4.5 V; I
FREQ.[MHz]
= 0 C to 70 C
= –40 C to +85 C
= 0 V (30/33 MHz max. CPU clock)
IN
CC
39
< V
CC
< 5.5 V
OL
OL
OH
OH
vs. Frequency.
CC
TL
= 1.6 mA
= 3.2 mA
= –30 A
= –3.2 mA
– 0.3
= –750
2
2
.
LIMITS
MIN
–0.5
0.2 V
0.7 V
V
V
–1
1.2
40
CC
CC
OL
OL
– 0.7
– 0.7
CC
CC
s of ALE and ports 1 and 3. The noise is due
can exceed these conditions provided that no
+0.9
P80C3xX2; P80C5xX2;
TYP
2
3
CC
1
–0.7 specification when the
MAX
0.2 V
V
V
0.4
0.4
–50
–650
30
50
225
15
10
CC
CC
+0.5
+0.5
CC
P87C5xX2
–0.1
Product data
UNIT
V
V
V
V
V
V
V
V
k
pF
A
A
A
A
A

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