ATMEGA165-16MI Atmel, ATMEGA165-16MI Datasheet - Page 208

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ATMEGA165-16MI

Manufacturer Part Number
ATMEGA165-16MI
Description
IC AVR MCU 16K 16MHZ 64-QFN
Manufacturer
Atmel
Series
AVR® ATmegar
Datasheets

Specifications of ATMEGA165-16MI

Core Processor
AVR
Core Size
8-Bit
Speed
16MHz
Connectivity
SPI, UART/USART, USI
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
54
Program Memory Size
16KB (8K x 16)
Program Memory Type
FLASH
Eeprom Size
512 x 8
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-MLF®, 64-QFN
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
TAP Controller
2573G–AVR–07/09
Figure 98. TAP Controller State Diagram
The TAP controller is a 16-state finite state machine that controls the operation of the
Boundary-scan circuitry, JTAG programming circuitry, or On-chip Debug system. The
state transitions depicted in Figure 98 depend on the signal present on TMS (shown
adjacent to each state transition) at the time of the rising edge at TCK. The initial state
after a Power-on Reset is Test-Logic-Reset.
As a definition in this document, the LSB is shifted in and out first for all Shift Registers.
Assuming Run-Test/Idle is the present state, a typical scenario for using the JTAG inter-
face is:
At the TMS input, apply the sequence 1, 1, 0, 0 at the rising edges of TCK to enter
the Shift Instruction Register – Shift-IR state. While in this state, shift the four bits of
the JTAG instructions into the JTAG Instruction Register from the TDI input at the
rising edge of TCK. The TMS input must be held low during input of the 3 LSBs in
order to remain in the Shift-IR state. The MSB of the instruction is shifted in when
this state is left by setting TMS high. While the instruction is shifted in from the TDI
pin, the captured IR-state 0x01 is shifted out on the TDO pin. The JTAG Instruction
selects a particular Data Register as path between TDI and TDO and controls the
circuitry surrounding the selected Data Register.
Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. The instruction
is latched onto the parallel output from the Shift Register path in the Update-IR
1
0
Test-Logic-Reset
Run-Test/Idle
0
1
1
0
Select-DR Scan
Capture-DR
Update-DR
Pause-DR
Exit1-DR
Exit2-DR
Shift-DR
1
0
0
1
0
1
1
0
1
1
0
0
ATmega165/V
1
0
Select-IR Scan
Capture-IR
Update-IR
Pause-IR
Exit1-IR
Exit2-IR
Shift-IR
1
0
0
1
0
1
1
0
1
1
0
0
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