DSP56F803BU80 Freescale Semiconductor, DSP56F803BU80 Datasheet - Page 51

IC DSP 80MHZ 31.5K FLASH 100LQFP

DSP56F803BU80

Manufacturer Part Number
DSP56F803BU80
Description
IC DSP 80MHZ 31.5K FLASH 100LQFP
Manufacturer
Freescale Semiconductor
Series
56F8xxr
Datasheet

Specifications of DSP56F803BU80

Core Processor
56800
Core Size
16-Bit
Speed
80MHz
Connectivity
CAN, EBI/EMI, SCI, SPI
Peripherals
POR, PWM, WDT
Number Of I /o
16
Program Memory Size
71KB (35.5K x 16)
Program Memory Type
FLASH
Ram Size
2.5K x 16
Voltage - Supply (vcc/vdd)
3 V ~ 3.6 V
Data Converters
A/D 8x12b
Oscillator Type
External
Operating Temperature
-40°C ~ 85°C
Package / Case
100-LQFP
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Eeprom Size
-

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Part 5 Design Considerations
5.1 Thermal Design Considerations
An estimation of the chip junction temperature, T
Where:
Historically, thermal resistance has been expressed as the sum of a junction-to-case thermal resistance and
a case-to-ambient thermal resistance:
Where:
R
change the case-to-ambient thermal resistance, R
the device, add a heat sink, change the mounting arrangement on the Printed Circuit Board (PCB), or
otherwise change the thermal dissipation capability of the area surrounding the device on the PCB. This
model is most useful for ceramic packages with heat sinks; some 90% of the heat flow is dissipated through
the case to the heat sink and out to the ambient environment. For ceramic packages, in situations where
the heat flow is split between a path to the case and an alternate path through the PCB, analysis of the
device thermal performance may need the additional modeling capability of a system level thermal
simulation tool.
The thermal performance of plastic packages is more dependent on the temperature of the PCB to which
the package is mounted. Again, if the estimations obtained from R
the thermal performance is adequate, a system level model may be appropriate.
Definitions:
A complicating factor is the existence of three common definitions for determining the junction-to-case
thermal resistance in plastic packages:
Freescale Semiconductor
θJC
is device-related and cannot be influenced by the user. The user controls the thermal environment to
T
R
P
R
R
R
Measure the thermal resistance from the junction to the outside surface of the package (case) closest to the
chip mounting area when that surface has a proper heat sink. This is done to minimize temperature variation
A
D
Equation 1:
θJA
Equation 2:
θJA
θJC
θCA
= ambient temperature °C
= power dissipation in package
= package junction-to-case thermal resistance °C/W
= package junction-to-ambient thermal resistance °C/W
= package junction-to-ambient thermal resistance °C/W
= package case-to-ambient thermal resistance °C/W
T
R
J
θJA
=
T
=
A
R
+
θJC
(
P
D
+
×
R
R
θCA
θJA
56F803 Technical Data, Rev. 16
)
θCA
J
, in °C can be obtained from the equation:
. For example, the user can change the air flow around
θJA
do not satisfactorily answer whether
Thermal Design Considerations
51

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