EM250-RTR Ember, EM250-RTR Datasheet - Page 106
![IC ZIGBEE SYSTEM-ON-CHIP 48-QFN](/photos/14/19/141904/636-48-qfn_sml.jpg)
EM250-RTR
Manufacturer Part Number
EM250-RTR
Description
IC ZIGBEE SYSTEM-ON-CHIP 48-QFN
Manufacturer
Ember
Series
EM250r
Datasheet
1.EM250-JMP-R.pdf
(117 pages)
Specifications of EM250-RTR
Frequency
2.4GHz
Modulation Or Protocol
802.15.4 Zigbee
Applications
Home/Building Automation, Industrial Control and Monitoring
Power - Output
3dBm
Sensitivity
-97dBm
Voltage - Supply
2 V ~ 3.6 V
Current - Receiving
35.5mA
Current - Transmitting
33mA
Data Interface
PCB, Surface Mount
Memory Size
128kB Flash, 5kB SRAM
Antenna Connector
PCB, Surface Mount
Operating Temperature
-40°C ~ 85°C
Package / Case
48-QFN
For Use With
636-1009 - PROGRAMMER USB FLASH EM250/260
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Data Rate - Maximum
-
Other names
636-1000-2
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
EM250-RTR
Manufacturer:
TI
Quantity:
3 400
Part Number:
EM250-RTR
Manufacturer:
EMBER
Quantity:
20 000
EM250
6 SIF Module Programming and Debug Interface
106
120-0082-000I
SIF is a synchronous serial interface developed by Cambridge Consultants Ltd. It is the primary programming
and debug interface of the EM250. Therefore, any design implementing the EM250 should make the SIF signals
readily available. The SIF module allows external devices to read and write memory-mapped registers in real-
time without changing the functionality or timing of the XAP2b core. See the EM250 Reference Design for de-
tails regarding the implementation of the SIF interface.
The SIF interface provides the following:
The pins are:
Because the SIF module directly connects to the program and data memory buses within the EM250, it has ac-
cess to the entire Flash and RAM blocks, as well as the on-chip registers.
The maximum serial shift speed for the SIF interface is 48MHz. SIF interface accesses can be initiated even
when the chip is in idle and deep sleep modes. An edge on nSIF_LOAD wakes the chip to allow SIF cycles.
IC production test (especially analog)
PCB production test
XAP2b code development
Product control and characterization
nSIF_LOAD
SIF_CLK
SIF_MOSI
SIF_MISO