ATMEGA64A-MNR Atmel, ATMEGA64A-MNR Datasheet - Page 253
ATMEGA64A-MNR
Manufacturer Part Number
ATMEGA64A-MNR
Description
IC MCU AVR 64K FLASH 8QFN
Manufacturer
Atmel
Series
AVR® ATmegar
Datasheet
1.ATMEGA64A-AU.pdf
(392 pages)
Specifications of ATMEGA64A-MNR
Core Processor
AVR
Core Size
8-Bit
Speed
16MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
53
Program Memory Size
64KB (32K x 16)
Program Memory Type
FLASH
Eeprom Size
2K x 8
Ram Size
4K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
*
Core
AVR8
Data Bus Width
8 bit
Data Ram Size
2 KB
Interface Type
SPI, UART, I2C
Maximum Clock Frequency
16 MHz
Number Of Programmable I/os
53
Operating Supply Voltage
2.7 V to 5.5 V
Maximum Operating Temperature
+ 105 C
Mounting Style
SMD/SMT
Operating Temperature Range
- 40 C to + 85 C
Processor To Be Evaluated
ATMEGA64A
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
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8160C–AVR–07/09
The IEEE std. 1149.1 also specifies an optional TAP signal; TRST – Test ReSeT – which is not
provided.
When the JTAGEN fuse is unprogrammed, these four TAP pins are normal port pins and the
TAP controller is in reset. When programmed and the JTD bit in MCUCSR is cleared, the TAP
input signals are internally pulled high and the JTAG is enabled for Boundary-scan and program-
ming. In this case, the TAP output pin (TDO) is left floating in states where the JTAG TAP
controller is not shifting data, and must therefore be connected to a pull-up resistor or other
hardware having pull-ups (for instance the TDI-input of the next device in the scan chain). The
device is shipped with this fuse programmed.
For the On-chip Debug system, in addition to the JTAG interface pins, the RESET pin is moni-
tored by the debugger to be able to detect External Reset sources. The debugger can also pull
the RESET pin low to reset the whole system, assuming only open collectors on the reset line
are used in the application.
• TMS: Test mode select. This pin is used for navigating through the TAP-controller state
• TCK: Test clock. JTAG operation is synchronous to TCK.
• TDI: Test Data In. Serial input data to be shifted in to the Instruction Register or Data Register
• TDO: Test Data Out. Serial output data from Instruction Register or Data Register.
machine.
(Scan Chains).
ATmega64A
253
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