ADUC7060BCPZ32 Analog Devices Inc, ADUC7060BCPZ32 Datasheet - Page 9

• Manufacturer Part Number: ADUC7060BCPZ32
• Description: DUAL 24-BIT AFE AND ARM 7 I.C
• Manufacturer: Analog Devices Inc
• Series: MicroConverter® ADuC7xxxr

Specifications of ADUC7060BCPZ32

• Design Resources: 4 mA-to-20 mA Loop-Powered Temperature Monitor Using ADuC7060/1 (CN0145) Low power, Long Range, ISM Wireless Measuring Node (CN0164)
• Core Processor: ARM7
• Core Size: 16/32-Bit
• Speed: 10MHz
• Connectivity: I²C, SPI, UART/USART
• Peripherals: POR, PWM, Temp Sensor, WDT
• Number Of I /o: 14
• Program Memory Size: 32KB (16K x 16)
• Program Memory Type: FLASH
• Ram Size: 4K x 8
• Voltage - Supply (vcc/vdd): 2.375 V ~ 2.625 V
• Data Converters: A/D 5x24b, 8x24b, D/A 1x14b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 32-LFCSP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Parameter
POWER REQUIREMENTS
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
These numbers are not production tested but are guaranteed by design and/or characterization data at production release.
Valid for primary ADC gain setting of PGA = 4 to 64.
Tested at gain range = 4 after initial offset calibration.
Measured with an internal short. A system zero-scale calibration removes this error.
Measured with an internal short.
These numbers do not include internal reference temperature drift.
Factory calibrated at gain = 1.
System calibration at a specific gain range removes the error at this gain range.
Measured using an external reference.
Limited by the minimum absolute input voltage range.
Measured using the box method.
References up to AVDD are accommodated by setting ADC0CON Bit 12.
Reference DAC linearity is calculated using a reduced code range of 171 to 4095.
Reference DAC linearity is calculated using a reduced code range of 2731 to 65,535.
Die temperature.
Endurance is qualified to 10,000 cycles as per JEDEC Std. 22 Method A117 and measured at −40°C, +25°C, and +125°C. Typical endurance at 25°C is 170,000 cycles.
Retention lifetime equivalent at junction temperature (T
Typical additional supply current consumed during Flash/EE memory program and erase cycles is 7 mA and 5 mA, respectively.
Power Supply Voltages
Power Consumption
DVDD (±5%)
AVDD (±5%)
I
I
I
I
I
PWM
DD
DD
DD
DD
DD
(Auxiliary ADC)
(DAC)
(MCU Normal Mode)
(MCU Powered Down)
(Primary ADC)
18
1
Test Conditions/Comments
MCU clock rate = 10.24 MHz,
ADC0 on
MCU clock rate = 640 kHz,
ADC0 on, G = 4, ADC1/DAC off,
SPI on; POWCON2 = 0x4
Full temperature range
Reduced temperature range
−40°C to +85°C
Full temperature range
Reduced temperature range
−40°C to +85°C
PGA enabled, normal mode/low
power mode; current is
dependent on gain setting
ADC0 on, G = 1, normal mode
ADC0 on, G = 4, normal mode
ADC0 on, G = >128, normal mode
Normal mode/low power mode
DAC0CON = 0x10
J
) = 85°C as per JEDEC Std. 22 Method A117. Retention lifetime derates with junction temperature.
1
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Min
2.375
2.375
Typ
2.5
2.5
6
55
55
0.6/0.3
0.03
0.44
0.63
0.35/0.1
0.33
0.34
ADuC7060/ADuC7061
Max
2.625
2.625
10
3.1
2.74
350
120
Unit
V
V
mA
mA
mA
μA
μA
mA
mA
mA
mA
mA
mA
mA