IKA03N120H2 Infineon Technologies, IKA03N120H2 Datasheet - Page 8

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IKA03N120H2

Manufacturer Part Number
IKA03N120H2
Description
IGBT 1200V 8.2A 29W TO220-3
Manufacturer
Infineon Technologies
Datasheet

Specifications of IKA03N120H2

Package / Case
TO-220-3 (Straight Leads)
Voltage - Collector Emitter Breakdown (max)
1200V
Vce(on) (max) @ Vge, Ic
2.8V @ 15V, 3A
Current - Collector (ic) (max)
8.2A
Power - Max
29W
Input Type
Standard
Mounting Type
Through Hole
Configuration
Single
Collector- Emitter Voltage Vceo Max
1200 V
Maximum Gate Emitter Voltage
+/- 20 V
Maximum Operating Temperature
+ 150 C
Continuous Collector Current Ic Max
8.2 A
Minimum Operating Temperature
- 40 C
Mounting Style
Through Hole
Switching Frequency
HighSpeed2 30-100 kHz
Package
TO-220
Vce (max)
1,200.0 V
Ic(max) @ 25°
-
Ic(max) @ 100°
8.2 A
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Igbt Type
-
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
IKA03N120H2XK

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
IKA03N120H2
Manufacturer:
INFINEON
Quantity:
12 500
Part Number:
IKA03N120H2
Quantity:
800
Part Number:
IKA03N120H2 E8153
Manufacturer:
ST
Quantity:
10 000
Power Semiconductors
Figure 13. Typical switching energy losses
as a function of collector current
(inductive load, T
V
dynamic test circuit in Fig.E )
Figure 15. Typical switching energy losses
as a function of junction temperature
(inductive load, V
V
dynamic test circuit in Fig.E )
CE
GE
0.5mJ
0.4mJ
0.3mJ
0.2mJ
0.1mJ
1.0mJ
0.5mJ
0.0mJ
= 800V, V
= +15V/0V, I
0A
1
due to diode recovery.
1
due to diode recovery.
T
) E
) E
25°C
j
I
,
C
on
on
JUNCTION TEMPERATURE
,
and E
and E
COLLECTOR CURRENT
GE
C
= +15V/0V, R
j
CE
= 150 C,
= 3A, R
ts
ts
2A
80°C
include losses
= 800V,
include losses
G
= 82 ,
125°C
G
4A
= 82 ,
150°C
E
E
E
ts
on
off
E
E
E
1
1
ts
off
on
1
1
8
Figure 16. Typical turn off switching energy
loss for soft switching
(dynamic test circuit in Fig. E)
Figure 14. Typical switching energy losses
as a function of gate resistor
(inductive load, T
V
dynamic test circuit in Fig.E )
CE
0.16mJ
0.12mJ
0.08mJ
0.04mJ
0.00mJ
0.7mJ
0.6mJ
0.5mJ
0.4mJ
0.3mJ
0.2mJ
= 800V, V
0V/us
0
E
I
1
due to diode recovery.
E
C
) E
on
=1A, T
dv/dt, VOLTAGE SLOPE
off
1
on
50
R
GE
1000V/us
and E
G
J
=150°C
,
= +15V/0V, I
j
GATE RESISTOR
I
= 150 C,
C
ts
=1A, T
100
include losses
I
C
=3A, T
IKA03N120H2
J
2000V/us
=25°C
150
J
=150°C
C
I
C
Rev. 2.2
= 3A,
=3A, T
200
3000V/us
J
=25°C
250
E
ts
July 06
1

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