10070D AGILENT TECHNOLOGIES, 10070D Datasheet - Page 25

• Manufacturer Part Number: 10070D
• Description: OSCILLOSCOPE PROBE, 1:1, 20MHZ
• Manufacturer: AGILENT TECHNOLOGIES

Specifications of 10070D

• Test Probe Type: Oscilloscope
• Test Probe Functions: Frequency
• For Use With: Infiniium 8000 Series Oscilloscopes
• Lead Free Status / RoHS Status: na

Infiniium Performance Characteristics
Measurements and math
Waveform measurements
Measurement modes
Statistics
Histograms (scope channels only)
Mask testing
AutoMask
Marker modes
Waveform math
FFT
Window modes
Voltage (scope channels only)
Time (all channels)
Time (scope channels only)
Mixed (scope channels only)
Frequency domain
Eye pattern
Jitter clock (scope only)
Jitter data (scope only)
Automatic measurements
QuickMeas+
Drag and drop measurement toolbar
Frequency range
Frequency resolution
Best resolution at maximum sample rate
Frequency accuracy
Signal-to-noise ratio
7
8
DSO8064A, MSO8064A, DSO8104A, MSO8104A
Peak-to-peak, minimum, maximum, average, RMS, amplitude, base, top, overshoot,
preshoot, upper, middle, lower, runt (with InfiniiScan)
Period, frequency, positive width, negative width, duty cycle, delta time
Rise time, fall time, Tmin, Tmax, channel-to-channel phase, setup time, hold time
Area, slew rate
FFT frequency, FFT magnitude, FFT delta frequency, FFT delta magnitude
Eye height, eye width, jitter, crossing %, Q-factor, duty cycle distortion
Cycle-cycle jitter, N-cycle jitter, cycle-cycle +width, cycle-cycle –width, cycle-cycle duty
cycle (all with EZJIT)
Time interval error (TIE), data rate, unit interval (all with EZJIT)
Measure menu access to all measurements, five measurements can be displayed
simultaneously with statistics
Front-panel button activates five pre-selected or five user-defined automatic measur ments
Measurement toolbar with common measurement icons that can be dragged and dropped
onto a particular displayed waveform cycle
Displays the mean, standard deviation, minimum, maximum range, and number of
measurement values for the displayed automatic measurements
Vertical (for timing and jitter measurements) or horizontal (noise and amplitude change)
modes, regions are defined using waveform markers. Measurements included: mean,
standard deviation, mode, peak-to-peak, median, total hits, peak (area of most hits), and
mean ± 1, 2, and 3 sigma
Allows pass/fail testing to user-defined or Agilent-supplied waveform templates.
allows user to create a mask template from a captured waveform and define tolerance
range in time/voltage or percentage. Test modes include test forever, test to specified time
or event limit, and stop on failure. Communications mask test kit option provides a set of
ITU-T G.703, ANSI T1.102, and IEEE 802.3 industry-standard masks for compliance testing.
Manual markers, track waveform data, track measurements
Four functions f1-f4. Select from add, average, common mode, differentiate, divide, FFT
magnitude, FFT phase, high pass filter, integrate, invert, low-pass filter, magnify, min, max,
multiply, smoothing, subtract, versus
DC to 2 GHz (2 channels), DC to 1 GHz (each channel)
Resolution = sample rate/memory depth
4 GSa/s/32 M = 125 Hz
(1/2 frequency resolution)+(5x10
80 dB at 1 Mpts memory depth
Hanning, flattop, rectangular
(continued)
-5
)(signal frequency)
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