STM32F217ZGT6 STMicroelectronics, STM32F217ZGT6 Datasheet - Page 115

• Manufacturer Part Number: STM32F217ZGT6
• Description: MCU ARM 1024KB FLASH 144LQFP
• Manufacturer: STMicroelectronics
• Series: STM32r

Specifications of STM32F217ZGT6

• Core Processor: ARM® Cortex-M3™
• Core Size: 32-Bit
• Speed: 120MHz
• Connectivity: CAN, Ethernet, I²C, IrDA, LIN, MMC, SPI, UART/USART, USB OTG
• Peripherals: Brown-out Detect/Reset, DMA, I²S, LCD, POR, PWM, WDT
• Number Of I /o: 114
• Program Memory Size: 1MB (1M x 8)
• Program Memory Type: FLASH
• Eeprom Size: -
• Ram Size: 132K x 8
• Voltage - Supply (vcc/vdd): 1.8 V ~ 3.6 V
• Data Converters: A/D 24x12b; D/A 2x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 144-LQFP
• Cpu Family: STM32
• Device Core: ARM Cortex-M3
• Device Core Size: 32b
• Frequency (max): 120MHz
• Total Internal Ram Size: 132KB
• # I/os (max): 114
• Number Of Timers - General Purpose: 14
• Operating Supply Voltage (typ): 2.5/3.3V
• Operating Supply Voltage (max): 3.6V
• Operating Supply Voltage (min): 1.8V
• On-chip Dac: 2(2-chx12-bit)
• Instruction Set Architecture: RISC
• Operating Temp Range: -40C to 85C
• Operating Temperature Classification: Industrial
• Mounting: Surface Mount
• Pin Count: 144
• Package Type: LQFP
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 497-11189

STM32F215xx, STM32F217xx
Figure 52. 12-bit buffered /non-buffered DAC
1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external loads directly
5.3.22
5.3.23
without the use of an external operational amplifier. The buffer can be bypassed by configuring the BOFFx bit in the
DAC_CR register.
Temperature sensor characteristics
Table 64.
1. Based on characterization, not tested in production.
2. Guaranteed by design, not tested in production.
3. Shortest sampling time can be determined in the application by multiple iterations.
V
Table 65.
1. TBD stands for “to be defined”.
2. Guaranteed by design, not tested in production.
3. Shortest sampling time can be determined in the application by multiple iterations.
Avg_Slope
T
BAT
T
S_temp
S_vbat
t
Symbol
Symbol
START
V
T
Er
25
L
Q
R
monitoring characteristics
(1)
(2)
(1)
(3)(2)
(3)(2)
(2)
(1)
TS characteristics
V
BAT
V
Average slope
Voltage at 25 °C
Startup time
ADC sampling time when reading the
temperature
1°C accuracy
Resistor bridge for V
Ratio on V
Error on Q
ADC sampling time when reading the V
1mV accuracy
SENSE
Buffered/Non-buffered DAC
monitoring characteristics
12-bit
digital to
analog
converter
linearity with temperature
BAT
measurement
Doc ID 17050 Rev 4
Parameter
Parameter
Buffer(1)
BAT
DACx_OUT
(1)
BAT
C
R
LOAD
LOAD
TBD
Min
Min
16
–1
-
-
-
-
-
-
(1)
Electrical characteristics
0.76
Typ
Typ
2.5
±1
50
ai17157
6
2
-
-
-
Max
Max
10
+1
±2
-
-
-
-
mV/°C
115/158
Unit
Unit
KΩ
°C
µs
µs
µs
%
V