SI3220-KQ Silicon Laboratories Inc, SI3220-KQ Datasheet - Page 99

• Manufacturer Part Number: SI3220-KQ
• Description: IC SLIC/CODEC DUAL-CH 64TQFP
• Manufacturer: Silicon Laboratories Inc
• Series: ProSLIC®r

Specifications of SI3220-KQ

• Package / Case: *
• Function: Subscriber Line Interface Concept (SLIC), CODEC
• Interface: GCI, PCM, SPI
• Number Of Circuits: 2
• Voltage - Supply: 3.3V, 5V
• Current - Supply: 65mA
• Power (watts): 941mW
• Operating Temperature: 0°C ~ 70°C
• Mounting Type: Surface Mount
• Includes: Battery Switching, BORSCHT Functions, DTMF Generation and Decoding, FSK Tone Generation, Modem and Fax Tone Detection
• Product: Telecom
• Supply Voltage (min): 3.13 V
• Supply Current: 22 mA
• Maximum Operating Temperature: + 70 C
• Minimum Operating Temperature: 0 C
• Mounting Style: SMD/SMT
• Number Of Channels: 2
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

Notes:
Addr
RAM
162
126
136
146
125
135
145
128
138
148
127
137
147
130
140
150
129
139
149
159
155
161
157
163
164
165
76
75
74
73
72
1.
2.
3.
4.
5.
6.
7.
Any register not listed is reserved and must not be written.
Only positive input values are valid for these RAM addresses.
Si3225 only.
Si3220 only.
For the Si3220, the RINGFRHI RAM address location is used to store the high byte of the internal ringing signal frequency. For the Si3225, this address location stores the desired time delay
between when the relay opens and when the LFS register transitions out of the ringing state.
For the Si3220, the RINGAMP RAM address location is used to store the amplitude of the internal ringing signal. For the Si3225, this address location stores the desired time relay between the last
zero current crossing and the next opportunity to open the ringing relay.
RAM address in decimal.
TESTPKTH
TESTAVTH
TESTB0H1
TESTB0H2
TESTB0H3
TESTB1H1
TESTB1H2
TESTB1H3
TESTB2H1
TESTB2H2
TESTB2H3
TESTPKFL
Mnemonic
TESTB0L1
TESTB0L2
TESTB0L3
TESTB1L1
TESTB1L2
TESTB1L3
TESTB2L1
TESTB2L2
TESTB2L3
TESTWLN
TXEQCO0
TXEQCO1
TXEQCO2
TXEQCO3
TESTPKO
TXGAIN
TXHPF1
TXHPF2
TXHPF3
TX Diag Filter Coeff B0H1
TX Diag Filter Coeff B0H2
TX Diag Filter Coeff B0H3
TX Diag Filter Coeff B1H1
TX Diag Filter Coeff B1H2
TX Diag Filter Coeff B1H3
TX Diag Filter Coeff B2H1
TX Diag Filter Coeff B2H2
TX Diag Filter Coeff B2H3
TX Diag Filter Coeff B0L1
TX Diag Filter Coeff B0L2
TX Diag Filter Coeff B0L3
TX Diag Filter Coeff B1L1
TX Diag Filter Coeff B1L2
TX Diag Filter Coeff B1L3
TX Diag Filter Coeff B2L1
TX Diag Filter Coeff B2L2
TX Diag Filter Coeff B2L3
TX HPF Coefficient 1
TX HPF Coefficient 2
TX HPF Coefficient 3
Peak Threshold
TX Gain Setting
Avg Threshold
TX Diag Filter
TX Diag Filter
TX Diag Filter
TX Diag Filter
TX Diag Filter
TX Equalizer
TX Equalizer
TX Equalizer
TX Equalizer
Description
Peak Output
Coefficient 0
Coefficient 1
Coefficient 2
Coefficient 3
Peak Flag
Bit
15
Bit
14
Bit
13
Bit
12
Bit
11
Preliminary Rev. 0.91
Transmit Path Gain and Filters
TESTAVTH[15:3]
TESTB0H1[15:3]
TESTB1H2[15:3]
TESTB0H3[15:3]
TESTB1H1[15:3]
TESTB1H2[15:3]
TESTB1H3[15:3]
TESTB2H1[15:3]
TESTB2H2[15:3]
TESTB2H3[15:3]
TESTPKFL[15:3]
TESTPKTH[15:3]
TESTB0L1[15:3]
TESTB0L2[15:3]
TESTB0L3[15:3]
TESTB1L1[15:3]
TESTB1L2[15:3]
TESTB1L3[15:3]
TESTB2L1[15:3]
TESTB2L2[15:3]
TESTB2L3[15:3]
Bit
TESTPKO[15:3]
TESTWLN[15:3]
TXEQCO0[15:3]
TXEQCO1[15:3]
TXEQCO2[15:3]
TXEQCO3[15:3]
10
TXHPF1[15:3]
TXHPF2[15:3]
TXHPF3[15:3]
TXGAIN[15:3]
Bit
9
Bit
8
Bit
7
Bit
6
Bit
5
Bit
4
Bit
3
Si3220/Si3225
Bit
2
Bit
1
Bit
0
Type
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Diag
Init
Init
Init
Init
Init
Example
4A6A
F84C
012C
004C
4000
Hex
Example
76201
–7888
1199
Dec
302
1
99
Unit
V