DS2155L Maxim Integrated Products, DS2155L Datasheet - Page 27

• Manufacturer Part Number: DS2155L
• Description: IC TXRX T1/E1/J1 1-CHIP 100-LQFP
• Manufacturer: Maxim Integrated Products

Specifications of DS2155L

• Function: Single-Chip Transceiver
• Interface: E1, HDLC, J1, T1
• Number Of Circuits: 1
• Voltage - Supply: 3.14 V ~ 3.47 V
• Current - Supply: 75mA
• Operating Temperature: 0°C ~ 70°C
• Mounting Type: Surface Mount
• Package / Case: 100-LQFP
• Includes: BERT Generator and Detector, CMI Coder and Decoder, HDLC Controller
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Power (watts): -

4.6 JTAG Test Access Port Pins
Signal Name:
Signal Description:
Signal Type:
JTRST is used to asynchronously reset the test access port controller. After power-up, JTRST must be toggled from
low to high. This action sets the device into the JTAG DEVICE ID mode. Normal device operation is restored by
pulling JTRST low. JTRST is pulled high internally by a 10kΩ resistor operation.
Signal Name:
Signal Description:
Signal Type:
This pin is sampled on the rising edge of JTCLK and is used to place the test access port into the various defined
IEEE 1149.1 states. This pin has a 10kΩ pullup resistor.
Signal Name:
Signal Description:
Signal Type:
This signal is used to shift data into JTDI on the rising edge and out of JTDO on the falling edge.
Signal Name:
Signal Description:
Signal Type:
Test instructions and data are clocked into this pin on the rising edge of JTCLK. This pin has a 10kΩ pullup
resistor.
Signal Name:
Signal Description:
Signal Type:
Test instructions and data are clocked out of this pin on the falling edge of JTCLK. If not used, this pin should be
left unconnected.
JTRST
IEEE 1149.1 Test Reset
Input
JTMS
IEEE 1149.1 Test Mode Select
Input
JTCLK
IEEE 1149.1 Test Clock Signal
Input
JTDI
IEEE 1149.1 Test Data Input
Input
JTDO
IEEE 1149.1 Test Data Output
Output
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