SAM7SE256 Atmel Corporation, SAM7SE256 Datasheet - Page 222
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SAM7SE256
Manufacturer Part Number
SAM7SE256
Description
Manufacturer
Atmel Corporation
Specifications of SAM7SE256
Flash (kbytes)
256 Kbytes
Pin Count
144
Max. Operating Frequency
48 MHz
Cpu
ARM7TDMI
Hardware Qtouch Acquisition
No
Max I/o Pins
88
Ext Interrupts
88
Usb Transceiver
1
Usb Speed
Full Speed
Usb Interface
Device
Spi
1
Twi (i2c)
1
Uart
3
Ssc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
8
Adc Resolution (bits)
10
Adc Speed (ksps)
384
Resistive Touch Screen
No
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
32
Self Program Memory
NO
External Bus Interface
1
Dram Memory
sdram
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
3.0 to 3.6
Fpu
No
Mpu / Mmu
Yes / No
Timers
3
Output Compare Channels
3
Input Capture Channels
3
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
No
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Debug in Depth
B-4
Scan chain 0
Scan chain 0 enables access to the entire periphery of the ARM7TDMI core, including
the data bus. The scan chain functions enable inter-device testing (EXTEST) and serial
testing of the core (INTEST). The order of the scan chain, from search data in to out, is:
1.
2.
3.
Scan chain 1
Scan chain 1 is a subset of scan chain 0. It provides serial access to the core data bus
D[31:0] and the BREAKPT signal.
There are 33 bits in this scan chain, the order from serial data in to serial data out, is:
1.
2.
Scan chain 2
Scan chain 2 enables access to the EmbeddedICE Logic registers. Refer to Test data
registers on page B-14 for details.
Data bus bits 0 to 31.
The control signals.
Address bus bits 31 to 0.
A[0] is scanned out first.
Data bus bits 0 to 31.
The BREAKPT bit, the first to be shifted out.
Embedded-ICE
Copyright © 1994-2001. All rights reserved.
Scan chain 2
Logic
Scan chain 0
Figure B-1 ARM7TDMI core scan chain arrangements
Scan chain 1
TAP controller
ARM7TDM
(CPU core)
ARM DDI 0029G
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