LSM320HAY30 STMicroelectronics, LSM320HAY30 Datasheet - Page 11

• Manufacturer Part Number: LSM320HAY30
• Description: Mems Motion Sensor Module 3d Digital Accelerometer And 2d Pitch And Yaw Analog Gyroscope
• Manufacturer: STMicroelectronics

LSM320HAY30
Table 2.
1. Linear acceleration (LA), Angular Rate (AR) parameter labeling
2. Typical specifications are not guaranteed
3. Verified by wafer level test and measurement of initial offset and sensitivity
4. Sensitivity and zero-rate offset are not ratiometric to supply voltage
5. Typical zero-g level offset value after MSL3 preconditioning
6. Offset can be eliminated by enabling the built-in high-pass filter
7. Refer to
8. The product is capable of measuring angular rates extending from DC to the selected BW.
9. The sign of “Self-test output change” is defined by LA_CTRL_REG4 STsign bit
10. Linear acceleration sensing Self-Test output changes with the power supply. “Self-test output change” is defined as
11. Output data reach 99% of final value after 1/ODR+1ms when enabling linear acceleration sensing self-test mode, due to
2.2
Table 3.
AR_ST
Top
AR_IddPdn
Symbol
LA_IddPdn
LA_IddLP
AR_IddSl
Symbol
Vdd_IO
AR_Idd
LA_Idd
OUTPUT[LSb]
Full-scale
device filtering.
Vdd
(1)
Table 23
Angular rate self-test output
change
Operating temperature range
Supply voltage
I/O pins supply voltage
Linear acceleration current
consumption in normal mode
Angular rate current consumption
in normal mode
Linear acceleration current
consumption in low-power mode
Angular rate current consumption
in sleep mode
Linear acceleration current
consumption in power-down mode
Angular rate current consumption
in power-down mode
Mechanical characteristics (continued)
Electrical characteristics
@ Vdd=3,0 V, T=25 °C unless otherwise noted.
Electrical characteristics
b. The product is factory calibrated at 3 V.
(LA_CTRL_REG4 ST bit=1)
for filter cut-off frequency.
Parameter
Parameter
- OUTPUT[LSb]
(2)
Doc ID 16917 Rev 1
(LA_CTRL_REG4 ST bit=0)
ODR = 50 Hz
ARPD pin
connected to GND
ODR
ARPD, ARST pin
connected to Vdd
ARPD pin
connected to Vdd
Test condition
Test conditions
LP
= 0.5 Hz
(b)
Mechanical and electrical specifications
. 1LSb=4g/4096 at 12bit representation, ±2 g
(Table
Min.
1.71
2.7
Min.
-40
27), for all axes.
Typ.
Typ.
0.25
250
3.0
6.8
2.1
10
1
1
(2)
(1)
Max.
+85
Vdd+0.1
Max.
3.6
5
5
Unit
mV
°C
11/42
Unit
mA
mA
mA
µA
µA
µA
V
V