IMX29F002 Macronix International, IMX29F002 Datasheet - Page 22

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IMX29F002

Manufacturer Part Number
IMX29F002
Description
2M-BIT [256K x 8] CMOS FLASH MEMORY
Manufacturer
Macronix International
Datasheet
SWITCHING TEST CIRCUITS
SWITCHING TEST WAVEFORMS(I) for speed grade 70ns max.
SWITCHING TEST WAVEFORMS(II) for speed grade 55ns(MX29F002T/B-55)
P/N: PM0547
0V
3.0V
0.45V
2.4V
DEVICE UNDER
AC TESTING: Inputs are driven at 3.0V for a logic "1" and 0V for a logic "0".
Input pulse rise and fall times are < 5ns.
TEST
AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0".
Input pulse rise and fall times are equal to or less than 20ns.
INPUT
INPUT
CL=100pF Including jig capacitance
CL=50pF for MX29F002T/B-55
1.5V
2.0V
0.8V
CL
TEST POINTS
22
TEST POINTS
1.2K ohm
MX29F002/002N
1.5V
0.8V
2.0V
OR EQUIVALENT
DIODES=IN3064
1.6K ohm
OUTPUT
OUTPUT
+5V
REV. 1.1, JUN. 14, 2001

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