MX29LV040 Macronix, MX29LV040 Datasheet - Page 19

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MX29LV040

Manufacturer Part Number
MX29LV040
Description
4M-Bit CMOS Single Voltage 3V Flash Memory
Manufacturer
Macronix
Datasheet

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AC CHARACTERISTICS
Table 9. READ OPERATIONS
TEST CONDITIONS:
• Input pulse levels: 0V/3.0V.
• Input rise and fall times is equal to or less than 5ns.
• Output load: 1 TTL gate + 100pF (Including scope and
• Reference levels for measuring timing: 1.5V.
P/N:PM0722
Symbol
tRC
tACC
tCE
tOE
tDF
tOEH
tOH
jig), for 29LV040-90 & 29LV040-12. 1 TTL gate + 30pF
(Including scope and jig) for 29LV040-70 & 29LV040-
55R.
PARAMETER
Read Cycle Time (Note 1)
Address to Output Delay
CE# to Output Delay
OE# to Output Delay
OE# High to Output Float (Note1) 0
Output Enable Read
Hold Time
Address to Output hold
Toggle and
Data# Polling
TA = -40
(TA = 0
o
C to 70
o
29LV040-55R 29LV040-70 29LV040-90
MIN.
55
0
10
0
C to 85
MAX. MIN.
55
55
30
25
o
C, VCC = 3.3V 5% for MX29LV040-55R)
o
C, VCC = 2.7V~3.6V
19
70
0
10
0
0
NOTE:
1. Not 100% tested.
2. tDF is defined as the time at which the output achieves
the open circuit condition and data is no longer driven.
MAX. MIN.
70
30
25
70
90
0
0
10
0
MAX. MIN. MAX. Unit Conditions
90
90
35
30
MX29LV040
29LV040-12
120
0
0
10
0
120
35
30
120
REV. 1.3, DEC. 20, 2004
ns
ns
ns
ns
ns
ns
ns
ns
=VIL
OE#=VIL
=VIL
CE#=OE#
CE#=VIL
CE#=VIL
CE#=OE#

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