PALCE26V12 AMD [Advanced Micro Devices], PALCE26V12 Datasheet - Page 16
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PALCE26V12
Manufacturer Part Number
PALCE26V12
Description
28-Pin EE CMOS Versatile PAL Device
Manufacturer
AMD [Advanced Micro Devices]
Datasheet
1.PALCE26V12.pdf
(21 pages)
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ENDURANCE CHARACTERISTICS
The PALCE26V12 is manufactured using AMD’s ad-
vanced Electrically Erasable process. This technology
uses an EE cell to replace the fuse link used in bipolar
Symbol
t
DR
N
Parameter
Min Pattern Data Retention Time
Min Reprogramming Cycles
PALCE26V12 Family
Max Storage Temperature
Max Operating Temperature
Normal Programming Conditions
Test Conditions
parts. As a result, the device can be erased and
reprogrammed—a feature which allows 100% testing at
the factory.
Min
100
10
20
AMD
Cycles
Years
Years
Unit
2–321