EVAL-ADXL312Z Analog Devices, EVAL-ADXL312Z Datasheet - Page 19

• Manufacturer Part Number: EVAL-ADXL312Z
• Description: Daughter Cards & OEM Boards EB Digital Output Three-Axis Accel
• Manufacturer: Analog Devices
• Series: ADXL312r

Specifications of EVAL-ADXL312Z

• Rohs: yes
• Product: Evaluation Boards
• Description/function: 3 axis accelerometer evaluation board
• Interface Type: I2C, SPI
• Maximum Operating Temperature: + 105 C
• Minimum Operating Temperature: - 40 C
• Operating Supply Voltage: 2 V to 3.6 V
• Factory Pack Quantity: 1
• For Use With: ADXL312

SELF-TEST
The ADXL312 incorporates a self-test feature that effectively
tests its mechanical and electronic systems simultaneously.
When the self-test function is enabled (via the SELF_TEST bit
in the DATA_FORMAT register, Address 0x31), an electrostatic
force is exerted on the mechanical sensor. This electrostatic force
moves the mechanical sensing element in the same manner as
acceleration, and it is additive to the acceleration experienced
by the device. This added electrostatic force results in an output
change in the x-, y-, and z-axes. Because the electrostatic force
is proportional to V
effect is shown in Figure 29. The scale factors shown in Table 13
can be used to adjust the expected self-test output limits for
different supply voltages, V
also exhibits a bimodal behavior. However, the limits shown in
Table 1 and Table 14 to Table 17 are valid for both potential self-
test values due to bimodality. Use of the self-test feature at data
rates less than 100 Hz or at 1600 Hz may yield values outside
these limits. Therefore, the part must be in normal power operation
(LOW_POWER bit = 0 in BW_RATE register, Address 0x2C)
and be placed into a data rate of 100 Hz through 800 Hz or 3200 Hz
for the self-test function to operate correctly.
–2
–4
–6
Figure 29. Self-Test Output Change Limits vs. Supply Voltage
6
4
2
0
X HIGH
X LOW
Y HIGH
Y LOW
Z HIGH
Z LOW
2.0
S
2
, the output change varies with V
2.5
S
. The self-test feature of the ADXL312
V
S
(V)
3.3
3.6
S
. This
Rev. 0 | Page 19 of 32
Table 13. Self-Test Output Scale Factors for Different Supply
Voltages, V
Supply Voltage, V
2.00 V
2.50 V
3.00 V
3.30 V
Table 14. Self-Test Output in LSB for ±1.5 g, 10-Bit or Full
Resolution (T
Axis
X
Y
Z
Table 15. Self-Test Output in LSB for ±3 g, 10-Bit Resolution
(T
Axis
X
Y
Z
Table 16. Self-Test Output in LSB for ±6 g, 10-Bit Resolution
(T
Axis
X
Y
Z
Table 17. Self-Test Output in LSB for ±12 g, 10-Bit
Resolution (T
Axis
X
Y
Z
A
A
= 25°C, V
= 25°C, V
S
S
S
A
A
= V
= V
= 25°C, V
= 25°C, V
Min
8
−90
12
Min
65
−725
100
Min
32
−362
50
Min
16
−181
25
S
DD I/O
DD I/O
X-, Y-Axes
0.64
1.00
1.77
2.11
= 2.5 V)
= 2.5 V)
S
S
= V
= V
DD I/O
DD I/O
= 2.5 V)
= 2.5 V)
Max
725
−65
1175
Max
362
−32
588
Max
181
−16
294
Max
90
−8
147
Z-Axis
0.8
1.00
1.47
1.69
ADXL312
Unit
LSB
LSB
LSB
Unit
LSB
LSB
LSB
Unit
LSB
LSB
LSB
Unit
LSB
LSB
LSB