AT91SAM7SE512-AU Atmel, AT91SAM7SE512-AU Datasheet - Page 49

IC ARM7 MCU FLASH 512K 128-LQFP

AT91SAM7SE512-AU

Manufacturer Part Number
AT91SAM7SE512-AU
Description
IC ARM7 MCU FLASH 512K 128-LQFP
Manufacturer
Atmel
Series
AT91SAMr
Datasheets

Specifications of AT91SAM7SE512-AU

Core Processor
ARM7
Core Size
16/32-Bit
Speed
55MHz
Connectivity
EBI/EMI, I²C, SPI, SSC, UART/USART, USB
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
88
Program Memory Size
512KB (512K x 8)
Program Memory Type
FLASH
Ram Size
32K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 1.95 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
128-LQFP
Cpu Family
91S
Device Core
ARM7TDMI
Device Core Size
32b
Frequency (max)
55MHz
Interface Type
EBI/SPI/TWI/USART
Total Internal Ram Size
32KB
# I/os (max)
88
Number Of Timers - General Purpose
3
Operating Supply Voltage (typ)
1.8/3.3V
Operating Supply Voltage (max)
1.95/3.6V
Operating Supply Voltage (min)
1.65/3V
On-chip Adc
8-chx10-bit
Instruction Set Architecture
RISC
Operating Temp Range
-40C to 85C
Operating Temperature Classification
Industrial
Mounting
Surface Mount
Pin Count
128
Package Type
LQFP
No. Of I/o's
88
Ram Memory Size
32KB
Cpu Speed
48MHz
No. Of Timers
3
No. Of Pwm Channels
4
Digital Ic Case Style
LQFP
Rohs Compliant
Yes
Processor Series
AT91SAMx
Core
ARM7TDMI
Data Bus Width
32 bit
Data Ram Size
32 KB
Maximum Clock Frequency
48 MHz
Number Of Programmable I/os
32
Number Of Timers
3
Operating Supply Voltage
1.8 V to 3.3 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
JTRACE-ARM-2M, KSK-AT91SAM7S-PL, MDK-ARM, RL-ARM, ULINK2
Development Tools By Supplier
AT91SAM-ICE, AT91-ISP, AT91SAM7SE-EK
Minimum Operating Temperature
- 40 C
For Use With
AT91SAM7SE-EK - EVAL BOARD FOR AT91SAM7SEAT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Compliant

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12. Debug and Test Features
12.1
12.2
6222F–ATARM–14-Jan-11
Overview
Block Diagram
The SAM7SE Series Microcontrollers feature a number of complementary debug and test capa-
bilities. A common JTAG/ICE (Embedded ICE) port is used for standard debugging functions,
such as downloading code and single-stepping through programs. The Debug Unit provides a
two-pin UART that can be used to upload an application into internal SRAM. It manages the
interrupt handling of the internal COMMTX and COMMRX signals that trace the activity of the
Debug Communication Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from
a PC-based test environment.
Figure 12-1. Debug and Test Block Diagram
PDC
Boundary
ARM7TDMI
TAP
DBGU
ICE
ICE/JTAG
SAM7SE512/256/32 Preliminary
TAP
Reset
Test
and
POR
JTAGSEL
TDO
TMS
TCK
TDI
DTXD
DRXD
TST
49

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