SLRC40001T/OFE,112 NXP Semiconductors, SLRC40001T/OFE,112 Datasheet - Page 114

• Manufacturer Part Number: SLRC40001T/OFE,112
• Description: IC I.CODE SLRC400 READER 32-SOIC
• Manufacturer: NXP Semiconductors
• Series: I-Coder

Specifications of SLRC40001T/OFE,112

• Rf Type: Read Only
• Frequency: 13.56MHz
• Features: ISO15693, ISO18000-3
• Package / Case: 32-SOIC (0.300", 7.50mm Width)
• Product: RFID Readers
• Operating Temperature Range: - 25 C to + 85 C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant
• Other names: 568-1124-5; 935269551112; SLRC400; SLRC41TOFED

Philips Semiconductors
I•CODE Reader IC
18.3 Analog Test-Signals
The analog test signals may be routed to pin AUX by selecting them with the register bits TestAnaOutSel.
Value
C
D
A
B
E
F
0
1
2
3
4
5
6
7
8
9
Signal Name
V
V
V
V
V
V
V
V
V
V
V
V
RFU
RFU
RFU
RxAmpQ
bandgap
V
RxFollQ
RxAmpI
CorrNQ
CorrDQ
RxFollI
CorrNI
CorrDI
EvalR
EvalL
Temp
mid
Table 18-2: Analog Test Signal Selection
Voltage at internal node Vmid
Internal reference voltage generated by the band gap.
Output signal from the demodulator using the I-clock.
Output signal from the demodulator using the Q-clock.
I-channel subcarrier signal amplified and filtered.
Q-channel subcarrier signal amplified and filtered.
Output signal of N-channel correlator fed by the I-channel subcarrier
signal.
Output signal of N-channel correlator fed by the Q-channel subcarrier
signal.
Output signal of D-channel correlator fed by the I-channel subcarrier
signal.
Output signal of D-channel correlator fed by the Q-channel subcarrier
signal.
Evaluation signal from the left half bit.
Evaluation signal from the right half bit.
Temperature voltage derived from band gap.
Reserved for future use
Reserved for future use
Reserved for future use
114
Product Specification Rev. 3.1 August 2004
Description
SL RC400