STPC STMicroelectronics, STPC Datasheet - Page 30

• Manufacturer Part Number: STPC
• Description: PC Compatible Embeded Microprocessor
• Manufacturer: STMicroelectronics

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ELECTRICAL SPECIFICATIONS
4. ELECTRICAL SPECIFICATIONS
4.1 Introduction
The electrical specifications in this chapter are val-
id for the STPC Consumer.
4.2 Electrical Connections
4.2.1 Power/Ground Connections/Decoupling
Due to the high frequency of operation of the
STPC Consumer, it is necessary to install and test
this device using standard high frequency tech-
niques. The high clock frequencies used in the
STPC Consumer and its output buffer circuits can
cause transient power surges when several output
buffers switch output levels simultaneously. These
effects can be minimized by filtering the DC power
leads with low-inductance decoupling capacitors,
using low impedance wiring, and by utilizing all of
the VSS and VDD pins.
4.2.2 Unused Input Pins
All inputs not used by the designer and not listed
in the table of pin connections in Chapter 3 should
be connected either to VDD or to VSS. Connect
active-high inputs to VDD through a 20 k ( 10%)
pull-down resistor and active-low inputs to VSS
and connect active-low inputs to VCC through a
Table 4-1. Absolute Maximum Ratings
30/51
Symbol
T
V
V
T
P
OPER
I
STG
DDx
, V
TOT
O
Parameter
DC Supply Voltage
Digital Input and Output Voltage
Storage Temperature
Operating Temperature
Total Power Dissipation
Issue 1.2
20 k
operation.
4.2.3 Reserved Designated Pins
Pins designated reserved should be left discon-
nected. Connecting a reserved pin to a pull-up re-
sistor, pull-down resistor, or an active signal could
cause unexpected results and possible circuit
malfunctions.
4.3 Absolute Maximum Ratings
The following table lists the absolute maximum
ratings for the STPC Consumer device. Stresses
beyond those listed under Table 4-1 limits may
cause permanent damage to the device. These
are stress ratings only and do not imply that oper-
ation under any conditions other than those spec-
ified in section ”Operating Conditions”.
Exposure to conditions beyond Table 4-1 may (1)
reduce device reliability and (2) result in prema-
ture failure even when there is no immediately ap-
parent sign of failure. Prolonged exposure to con-
ditions at or near the absolute maximum ratings
(Table 4-1) may also result in reduced useful life
and reliability.
( 10%) pull-up resistor to prevent spurious
-0.3, VDD + 0.3
-40, +150
-0.3, 4.0
0, +70
Value
4.8
Units
W
V
V
C
C