C8051F064-GQ Silicon Laboratories Inc, C8051F064-GQ Datasheet - Page 37

IC 8051 MCU 64K FLASH 100TQFP

C8051F064-GQ

Manufacturer Part Number
C8051F064-GQ
Description
IC 8051 MCU 64K FLASH 100TQFP
Manufacturer
Silicon Laboratories Inc
Series
C8051F06xr
Datasheets

Specifications of C8051F064-GQ

Program Memory Type
FLASH
Program Memory Size
64KB (64K x 8)
Package / Case
100-TQFP, 100-VQFP
Core Processor
8051
Core Size
8-Bit
Speed
25MHz
Connectivity
EBI/EMI, SMBus (2-Wire/I²C), SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
59
Ram Size
4.25K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 3.6 V
Data Converters
A/D 2x16b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Processor Series
C8051F0x
Core
8051
Data Bus Width
8 bit
Data Ram Size
4.25 KB
Interface Type
I2C, SMBus, SPI, UART
Maximum Clock Frequency
25 MHz
Number Of Programmable I/os
59
Number Of Timers
5
Operating Supply Voltage
2.7 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
PK51, CA51, A51, ULINK2
Development Tools By Supplier
C8051F060DK
Minimum Operating Temperature
- 40 C
On-chip Adc
16 bit, 1 Channel
On-chip Dac
12 bit, 2 Channel
No. Of I/o's
59
Ram Memory Size
4352Byte
Cpu Speed
25MHz
No. Of Timers
5
Rohs Compliant
Yes
Package
100TQFP
Device Core
8051
Family Name
C8051F06x
Maximum Speed
25 MHz
Data Rom Size
64 KB
A/d Bit Size
16 bit
A/d Channels Available
1
Height
1.05 mm
Length
14 mm
Supply Voltage (max)
3.6 V
Supply Voltage (min)
2.7 V
Width
14 mm
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With
336-1219 - KIT EVAL FOR C8051F064
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
336-1218

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Manufacturer
Quantity
Price
Part Number:
C8051F064-GQ
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SiliconL
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Manufacturer:
Silicon Laboratories Inc
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Part Number:
C8051F064-GQR
0
2.
Parameter
Ambient temperature under bias
Storage Temperature
Voltage on any pin (except VDD, AV+, AVDD, and
Port 0) with respect to DGND
Voltage on any Port 0 Pin with respect to DGND.
Voltage on VDD, AV+, or AVDD with respect to DGND
Maximum Total current through VDD, AV+, AVDD,
DGND, and AGND
Maximum output current sunk by any Port pin
Maximum output current sunk by any other I/O pin
Maximum output current sourced by any Port pin
Maximum output current sourced by any other I/O pin
*
device. This is a stress rating only and functional operation of the devices at those or any other conditions
above those indicated in the operation listings of this specification is not implied. Exposure to maximum
rating conditions for extended periods may affect device reliability.
Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
Absolute Maximum Ratings
Table 2.1. Absolute Maximum Ratings
Rev. 1.2
C8051F060/1/2/3/4/5/6/7
Conditions
*
Min
-0.3
-0.3
-0.3
-55
-65
Typ
Max
VDD +
125
150
800
100
100
0.3
5.8
4.2
50
50
Units
mA
mA
mA
mA
mA
°C
°C
V
V
V
37

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