ATXMEGA32A4-CUR Atmel, ATXMEGA32A4-CUR Datasheet - Page 292

MCU AVR 32+4 FLASH 49VFBGA

ATXMEGA32A4-CUR

Manufacturer Part Number
ATXMEGA32A4-CUR
Description
MCU AVR 32+4 FLASH 49VFBGA
Manufacturer
Atmel
Series
AVR® XMEGAr
Datasheets

Specifications of ATXMEGA32A4-CUR

Core Processor
AVR
Core Size
8/16-Bit
Speed
32MHz
Connectivity
I²C, IrDA, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, DMA, POR, PWM, WDT
Number Of I /o
34
Program Memory Size
32KB (16K x 16)
Program Memory Type
FLASH
Eeprom Size
2K x 8
Ram Size
4K x 8
Voltage - Supply (vcc/vdd)
1.6 V ~ 3.6 V
Data Converters
A/D 12x12b, D/A 2x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
49-VFBGA
For Use With
ATAVRONEKIT - KIT AVR/AVR32 DEBUGGER/PROGRMMRATSTK600 - DEV KIT FOR AVR/AVR32770-1007 - ISP 4PORT ATMEL AVR MCU SPI/JTAG770-1004 - ISP 4PORT FOR ATMEL AVR MCU SPI
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ATXMEGA32A4-CUR
Manufacturer:
Atmel
Quantity:
10 000
25.3.3
25.3.4
8077H–AVR–12/09
Single ended input
Internal inputs
For single ended measurements all analog input pins can be used as inputs. Single ended mea-
surements can be done in both signed and unsigned mode.
The negative input is connected to internal ground in signed mode.
Figure 25-4. Single-ended measurement in signed mode
In unsigned mode the negative input is connected to half of the voltage reference (VREF) volt-
age minus a fixed offset. The nominal value for the offset is:
Since the ADC is differential, unsigned mode is achieved by dividing the reference by two inter-
nally, resulting in an input range from VREF to zero for the positive single ended input. The
offset enables the ADC to measure zero cross detection in unsigned mode, and to calibrate any
positive offset where the internal ground in the device is higher than the external ground. See
Figure 25-11 on page 296
Figure 25-5. Single ended measurement in unsigned mode
Four internal analog signals can be selected as input and measured by the ADC.
The voltage output from an internal temperature reference can be measured with the ADC and
the voltage output will give an ADC result representing the current temperature in the microcon-
troller. During production test, the ADC measures a fixed temperature using the internal
• Temperature sensor
• Bandgap voltage
• V
• DAC output
CC
scaled
ADC0
ADC1
ADC2
ADC3
ADC4
ADC5
ADC6
ADC7
ADC0
ADC1
ADC2
ADC3
ADC4
ADC5
ADC6
ADC7
for details.
ΔV
VREF
=
2
VREF 0.05
Δ
V
×
+
-
+
-
ADC
ADC
XMEGA A
292

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