ATMEGA169V-8MI Atmel, ATMEGA169V-8MI Datasheet - Page 231
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ATMEGA169V-8MI
Manufacturer Part Number
ATMEGA169V-8MI
Description
IC MCU AVR 16K 1.8V 1MHZ 64-QFN
Manufacturer
Atmel
Series
AVR® ATmegar
Specifications of ATMEGA169V-8MI
Core Processor
AVR
Core Size
8-Bit
Speed
8MHz
Connectivity
SPI, UART/USART, USI
Peripherals
Brown-out Detect/Reset, LCD, POR, PWM, WDT
Number Of I /o
54
Program Memory Size
16KB (8K x 16)
Program Memory Type
FLASH
Eeprom Size
512 x 8
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-MLF®, 64-QFN
For Use With
ATAVRBFLY - KIT EVALUATION AVR BUTTERFLYATSTK502 - MOD EXPANSION AVR STARTER 500
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Other names
ATMEGA169V-1MI
ATMEGA169V-1MI
ATMEGA169V-1MI
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On-chip Debug Related
Register in I/O Memory
On-chip Debug Register –
OCDR
Using the JTAG
Programming
Capabilities
Bibliography
2514P–AVR–07/06
The OCDR Register provides a communication channel from the running program in the
microcontroller to the debugger. The CPU can transfer a byte to the debugger by writing
to this location. At the same time, an internal flag; I/O Debug Register Dirty – IDRD – is
set to indicate to the debugger that the register has been written. When the CPU reads
the OCDR Register the 7 LSB will be from the OCDR Register, while the MSB is the
IDRD bit. The debugger clears the IDRD bit when it has read the information.
In some AVR devices, this register is shared with a standard I/O location. In this case,
the OCDR Register can only be accessed if the OCDEN Fuse is programmed, and the
debugger enables access to the OCDR Register. In all other cases, the standard I/O
location is accessed.
Refer to the debugger documentation for further information on how to use this register.
Programming of AVR parts via JTAG is performed via the 4-pin JTAG port, TCK, TMS,
TDI, and TDO. These are the only pins that need to be controlled/observed to perform
JTAG programming (in addition to power pins). It is not required to apply 12V externally.
The JTAGEN Fuse must be programmed and the JTD bit in the MCUCR Register must
be cleared to enable the JTAG Test Access Port.
The JTAG programming capability supports:
•
•
•
•
The Lock bit security is exactly as in parallel programming mode. If the Lock bits LB1 or
LB2 are programmed, the OCDEN Fuse cannot be programmed unless first doing a
chip erase. This is a security feature that ensures no back-door exists for reading out the
content of a secured device.
The details on programming through the JTAG interface and programming specific
JTAG instructions are given in the section “Programming via the JTAG Interface” on
page 285.
For more information about general Boundary-scan, the following literature can be
consulted:
•
•
Bit
Read/Write
Initial Value
Flash programming and verifying.
EEPROM programming and verifying.
Fuse programming and verifying.
Lock bit programming and verifying.
IEEE: IEEE Std. 1149.1-1990. IEEE Standard Test Access Port and Boundary-scan
Architecture, IEEE, 1993.
Colin Maunder: The Board Designers Guide to Testable Logic Circuits, Addison-
Wesley, 1992.
MSB/IDRD
R/W
7
0
R/W
6
0
R/W
5
0
R/W
4
0
R/W
3
0
R/W
2
0
ATmega169/V
R/W
1
0
LSB
R/W
0
0
OCDR
231
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