AT91SAM7SE256B-AUR Atmel, AT91SAM7SE256B-AUR Datasheet - Page 615
AT91SAM7SE256B-AUR
Manufacturer Part Number
AT91SAM7SE256B-AUR
Description
IC ARM7 MCU FLASH 256K 128-LQFP
Manufacturer
Atmel
Series
AT91SAMr
Datasheet
1.AT91SAM7SE256-AU.pdf
(673 pages)
Specifications of AT91SAM7SE256B-AUR
Core Processor
ARM7
Core Size
16/32-Bit
Speed
55MHz
Connectivity
EBI/EMI, I²C, SPI, SSC, UART/USART, USB
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
88
Program Memory Size
256KB (256K x 8)
Program Memory Type
FLASH
Ram Size
32K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 1.95 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
*
Processor Series
SAM7SE256
Core
ARM7TDMI
Data Bus Width
32 bit
Data Ram Size
32 KB
Interface Type
SPI, USB
Maximum Clock Frequency
48 MHz
Number Of Programmable I/os
88
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Operating Temperature Range
- 40 C to + 85 C
Processor To Be Evaluated
AT91SAM7SE256B
Supply Current (max)
60 uA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Details
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Part Number
Manufacturer
Quantity
Price
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40. SAM7SE512/256/32 Electrical Characteristics
40.1
Table 40-1.
6222F–ATARM–14-Jan-11
Operating Temperature (Industrial).........-40⋅ C to + 85⋅ C
Storage Temperature............................-60°C to + 150°C
Voltage on Input Pins
with Respect to Ground............................-0.3V to + 5.5V
Maximum Operating Voltage
(VDDCORE, and VDDPLL).......................................2.0V
Maximum Operating Voltage
(VDDIO, VDDIN and VDDFLASH).............................4.0V
Total DC Output Current on all I/O lines
128-lead LQFP/144-ball LFBGA...........................200 mA
Absolute Maximum Ratings
Absolute Maximum Ratings*
*NOTICE:
SAM7SE512/256/32 Preliminary
Stresses beyond those listed under “Absolute Maxi-
mum Ratings” may cause permanent damage to
the device. This is a stress rating only and func-
tional operation of the device at these or other con-
ditions beyond those indicated in the operational
sections of this specification is not implied. Expo-
sure to absolute maximum rating conditions for
extended periods may affect device reliability.
615
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