AD7266BCPZ-REEL Analog Devices Inc, AD7266BCPZ-REEL Datasheet - Page 6

IC,Data Acquisition System,6-CHANNEL,12-BIT,LLCC,32PIN,PLASTIC

AD7266BCPZ-REEL

Manufacturer Part Number
AD7266BCPZ-REEL
Description
IC,Data Acquisition System,6-CHANNEL,12-BIT,LLCC,32PIN,PLASTIC
Manufacturer
Analog Devices Inc
Datasheet

Specifications of AD7266BCPZ-REEL

Design Resources
AD7266 SAR ADC in DC-Coupled Differential and Single-Ended Appls (CN0039)
Number Of Bits
12
Sampling Rate (per Second)
2M
Data Interface
DSP, MICROWIRE™, QSPI™, Serial, SPI™
Number Of Converters
2
Power Dissipation (max)
33.6mW
Voltage Supply Source
Analog and Digital
Operating Temperature
-40°C ~ 125°C
Mounting Type
Surface Mount
Package / Case
32-VFQFN, CSP Exposed Pad
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With
EVAL-AD7266CBZ - BOARD EVALUATION FOR AD7266
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
AD7266
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter
V to AGND
DV to DGND
V
V
AV to DV
AGND to DGND
Analog Input Voltage to AGND
Digital Input Voltage to DGND
Digital Output Voltage to GND
V
Operating Temperature Range
Storage Temperature Range
Junction Temperature
LFCSP/TQFP
Lead Temperature, Soldering
ESD
1
Transient currents of up to 100 mA will not cause latch up.
DD
DRIVE
DRIVE
REF
Input Current to Any Pin
Except Supplies
θ
θ
Reflow Temperature (10 to 30 sec)
DD
DD
JA
JC
to AGND
to DGND
to AGND
Thermal Impedance
Thermal Impedance
DD
1
−0.3 V to AV
−0.3 V to +0.3 V
−40°C to +125°C
1.5 kV
Rating
−0.3 V to +7 V
−0.3 V to +7 V
−0.3 V to DV
−0.3 V to +0.3 V
−0.3 V to AV + 0.3 V
−0.3 V to +7 V
−0.3 V to V
−0.3 V to AV
±10 mA
−65°C to +150°C
150°C
108.2°C/W (LFCSP)
55°C/W (TQFP)
32.71°C/W (LFCSP)
255°C
DRIVE
DD
DD
DD
DD
+ 0.3 V
+ 0.3 V
Rev. A | Page 6 of 28
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION

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