MPC2605ZP83 Freescale, MPC2605ZP83 Datasheet - Page 28

• Manufacturer Part Number: MPC2605ZP83
• Manufacturer: Freescale

Specifications of MPC2605ZP83

• Operating Temperature (max): 85C
• Mounting: Surface Mount
• Operating Temperature Classification: Commercial
• Lead Free Status / RoHS Status: Not Compliant

MPC2605/D
INSTRUCTION SET
is included on this device. When the TAP (Test Access
Port) controller is in the SHIFT-IR state, the
instruction register is placed between TDI and TDO.
In this state, the desired instruction would be serially
loaded through the TDI input. TRST resets the TAP
controller to the test-logic reset state. The TAP
instruction set for this device is as follows.
STANDARD INSTRUCTIONS
SAMPLE/PRELOAD TAP INSTRUCTION
to allow scanning of the boundary scan register
without causing interference to the normal operation
of the chip logic. The 169-bit boundary scan register
contains bits for all device signal and clock pins and
associated control signals. This register is accessible
when the SAMPLE/PRELOAD TAP instruction is
loaded into the TAP instruction register in the
SHIFT-IR state. When the TAP controller is then
moved to the SHIFT-DR state, the boundary scan
register is placed between TDI and TDO. This scan
register can then be used prior to the EXTEST
instruction to preload the output pins with desired
values, so that these pins will drive the desired state
when the EXTEST instruction is loaded. As data is
written into TDI, data also streams out of TDO, where
it can be used to pre-sample the inputs and outputs.
the CLAMP instruction to preload the values on the
28
*Default state at power up.
SAMPLE/PRELOAD
A five-pin IEEE Standard 1149.1 Test Port (JTAG)
The SAMPLE/PRELOAD TAP instruction is used
SAMPLE/PRELOAD would also be used prior to
Instruction
BYPASS
EXTEST
CLAMP
HIGHZ
(Binary)
Code
1111*
0010
0000
1001
1100
Bypass instruction
Sample and/or preload
instruction
Extest instruction
High-Z all output pins
while bypass register is
between TDI and TDO
Clamp output pins while
bypass register is
between TDI and TDO
Integrated Secondary Cache for Microprocessors
Freescale Semiconductor, Inc.
TEST ACCESS PORT DESCRIPTION
For More Information On This Product,
Description
That Implement PowerPC Architecture
Go to: www.freescale.com
output pins that will be driven out when the CLAMP
instruction is loaded.
EXTEST TAP INSTRUCTION
conjunction with the SAMPLE/PRELOAD instruction
to assist in testing board level connectivity. Normally,
the SAMPLE/PRELOAD instruction would be used to
preload all output pins. The EXTEST instruction
would then be loaded. During EXTEST, the boundary
scan register is placed between TDI and TDO in the
SHIFT-DR state of the TAP controller. Once the
EXTEST instruction is loaded, the TAP controller
would then be moved to the run-test/idle state. In this
state, one cycle of TCK would cause the preloaded
data on the output pins to be driven while the values
on the input pins would be sampled. Note the TCK,
not the clock pin (CLK), is used as the clock input
while CLK is only sampled during EXTEST. After
one clock cycle of TCK, the TAP controller would
then be moved to the SHIFT-DR state where the
sampled values would be shifted out of TDO (and new
values would be shifted in TDI). These values would
normally be compared to expected values to test for
board connectivity.
CLAMP TAP INSTRUCTION
state of the signals driven from the output pins to be
determined from the boundary scan register while the
bypass register is selected as the serial path between
TDI and TDO. The signals driven from the output pins
will not change while the CLAMP instruction is
selected. EXTEST could also be used for this purpose,
but CLAMP shortens the board scan path by inserting
only the bypass register between TDI and TDO. To
use CLAMP, the SAMPLE/PRELOAD instruction
would be used first to scan in the values that will be
driven on the output pins when the CLAMP
instruction is active.
HIGHZ TAP INSTRUCTION
outputs to be placed in an inactive drive state
(High-Z). During the HIGHZ instruction, the bypass
register is connected between TDI and TDO.
The EXTEST instruction is intended to be used in
The CLAMP instruction is provided to allow the
The HIGHZ instruction is provided to allow all the
MOTOROLA