5962-9098501MRA E2V, 5962-9098501MRA Datasheet - Page 10

• Manufacturer Part Number: 5962-9098501MRA
• Manufacturer: E2V

Specifications of 5962-9098501MRA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
Propagation delay
1/
2/
4/
5/
6/
7/
3/
time, I
output
3003
test method 1/
MIL-STD-883
For tests not listed in the referenced MIL-STD-883, [e.g. I
listed herein.
Each input/output, as applicable, shall be tested at the specified temperature, for the specified limits, to the tests in table I
herein. Output terminals not designated shall be high level logic, low level logic, or open, except for all I
terminal shall be open. When performing these tests, the current meter shall be placed in the circuit such that all current
flows through the meter.
For negative and positive voltage and current values, the sign designates the potential difference in reference to GND and
the direction of current flow, respectively; and the absolute value of the magnitude, not the sign, is relative to the minimum
and maximum limits, as applicable, listed herein.
For device classes B, S, Q, and V, this test is guaranteed, if not tested, to the limits specified in table I.
RHA samples do not have to be tested at -55C and +125C prior to irradiation.
When performing post irradiation electrical measurements for any RHA level, T
T
RHA parts for device type 01 of this drawing have been characterized through all levels M, D, P, L, and R.
RHA parts for device type 03 of this drawing have been characterized through all levels M, D, P, L, R, and F of irradiation.
However, these devices are only tested at the 'F' level. Pre and post irradiation values are identical unless otherwise
specified in table I. When performing post irradiation electrical measurements for any RHA level, T
Test and
A
= +25C ±5C.
DEFENSE SUPPLY CENTER COLUMBUS
A=B
to
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
Symbol
12/ 13/
t
6/ 7/
t
PLH2
PHL2
,
TABLE IA. Electrical performance characteristics - Continued.
C
R
See figure 4
C
R
See figure 4
L
L
L
L
= 50 pF minimum
= 500
= 50 pF minimum
= 500
unless otherwise specified
Test conditions 2/ 3/
+3.0 V  V
-55C  T
C
CC
 +125C
 +5.5 V
CC
(O/V1)], utilize the general test procedure under the conditions
SIZE
B, S, Q, V
B, S, Q, V
A
Device
device
class
type
Q, V
Q, V
and
All
01
02
03
All
01
02
03
M
M
M
M
REVISION LEVEL
3.0 V
4.5 V
A
V
= 25C. Limits shown are guaranteed at
CC
subgroups
Group A
C
10, 11
10, 11
10, 11
10, 11
10, 11
10, 11
9, 11
9, 11
10
10
9
9
9
9
9
9
A
1.0
1.0
= +25C.
Min
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
Limits 4/
CC
SHEET
tests, the output
5962-90985
Max
10.5
10.5
11.4
14.5
17.0
11.0
12.5
9.0
9.0
9.8
6.5
8.0
6.5
8.0
7.1
8.6
10
Unit
ns