5962-9098501MRA E2V, 5962-9098501MRA Datasheet - Page 17

• Manufacturer Part Number: 5962-9098501MRA
• Manufacturer: E2V

Specifications of 5962-9098501MRA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for
groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.5).
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for
device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed
for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.5).
4.2.2 Additional criteria for device classes B, S, Q, and V.
4.2.3 Percent defective allowable (PDA).
4.3 Qualification inspection for device classes B, S, Q, and V. Qualification inspection for device classes B, S, Q, and V shall
4.4 Conformance inspection. Technology conformance inspection for classes B, S, Q, and V shall be in accordance with
b.
c.
a.
b.
c.
a.
b.
c.
d.
e.
DEFENSE SUPPLY CENTER COLUMBUS
Interim and final electrical test parameters shall be as specified in table II herein.
For class S devices, post dynamic burn-in, or class B devices, post static burn-in, electrical parameter measurements
may, at the manufacturer’s option, be performed separately or included in the final electrical parameter requirements.
The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
Interim and final electrical test parameters shall be as specified in table II herein.
Additional screening for device class V or S beyond the requirements of device class Q or B shall be as specified in
MIL-PRF-38535, appendix B.
The PDA for class S or V devices shall be 5 percent for static burn-in and 5 percent for dynamic burn-in, based on the
exact number of devices submitted to each separate burn-in.
Static burn-in I and II failures shall be cumulative for determining the PDA.
The PDA for class B or Q devices shall be in accordance with MIL-PRF-38535 for static burn-in. Dynamic burn-in is
not required.
The PDA for class M devices shall be in accordance with MIL-PRF-38535, appendix A for static burn-in and dynamic
burn-in.
Those devices whose measured characteristics, after burn-in, exceed the specified delta limits or electrical parameter
limits specified in table I, subgroup I, are defective and shall be removed from the lot. The verified number of failed
devices times 100, divided by the total number of devices in the lot initially submitted to burn-in shall be used to
determine the percent defective for the lot, and the lot shall be accepted or rejected based on the specified PDA.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
SIZE
A
REVISION LEVEL
C
SHEET
5962-90985
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