5962-9098501MRA E2V, 5962-9098501MRA Datasheet - Page 19

• Manufacturer Part Number: 5962-9098501MRA
• Manufacturer: E2V

Specifications of 5962-9098501MRA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
table IIA herein. For device class S steady steady-state life tests, the test circuit shall be maintained by the manufacturer and
shall be made available to the acquiring or preparing activity upon request.
4.4.1 Group A inspection
4.4.2 Group B inspection. When applicable, the group B inspection end-point electrical parameters shall be as specified in
a.
b.
c.
d.
e.
DEFENSE SUPPLY CENTER COLUMBUS
Tests shall be as specified in table IIA herein.
For device class M, subgroups 7 and 8 tests shall be sufficient to verify the truth table in figure 2 herein. The test
vectors used to verify the truth table shall test all possible input to output combinations. For device classes B, S, Q,
and V, subgroups 7 and 8 shall include verifying the functionality of the device.
C
capacitance. C
tested in accordance with the latest revision of JEDEC Standard No. 20 and table I herein. For C
applicable pins on five devices with zero failures.
For device classes B, S, Q, and V, subgroups 9 and 11 tests shall be measured only for initial qualifications and after
process or design changes which may affect dynamic performance.
Latch-up tests are required for device classes B, S, Q, and V. These tests shall be performed only for initial
qualification and after process or design changes which may affect the performance of the device. Latch-up tests
shall be considered destructive. For latch-up tests, test all applicable pins on five devices with zero failures.
IN
MICROCIRCUIT DRAWING
and C
COLUMBUS, OHIO 43218-3990
PD
shall be measured only for initial qualification and after process or design changes which may affect
STANDARD
IN
shall be measured between the designated terminal and GND at a frequency of 1 MHz. C
Quiescent supply current
Supply current
Input current low level
Input current high level
Output voltage low level
Output voltage high level
1/ These parameters shall be recorded before and after the required
2/ These parameters shall be recorded before and after the required burn-in and
(V
(V
TABLE IIB. Burn-in and operating life test, delta parameters (+25C).
CC
CC
burn-in and life tests to determined delta limits.
life tests to determine the delta limits.
= 5.5 V, I
= 5.5 V, I
Parameter 1/
OL
OH
= 24 mA)
= -24 mA)
I
CCH
I
Symbol
CCH
, I
V
V
CCL
I
I
, I
IH
IL
OH
OL
CCL
, I
CCZ
SIZE
A
Device
type
01
03
03
03
03
03
REVISION LEVEL
Delta limits
100 nA
300 nA
0.04 V
0.20 V
20 nA
20 nA
C
IN
and C
SHEET
5962-90985
PD
, test all
PD
19
shall be