5962-9098501MRA E2V, 5962-9098501MRA Datasheet - Page 11

• Manufacturer Part Number: 5962-9098501MRA
• Manufacturer: E2V

Specifications of 5962-9098501MRA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
8/
9/
10/ See EIA/JEDEC Standard No. 78 for electrically induced latch-up test methods and procedures. The values listed for I
11/ Tests shall be performed in sequence, attributes data only. Functional tests shall include the truth table and other logic
12/ Device classes B, S, Q, and V are tested at V
13/ AC limits at V
Transmission driving tests are performed at V
using V
class M, subgroup 1 testing shall be guaranteed if not tested to the limits specified in table I. For radiation hardness
assured (RHA) devices, subgroup 1 testing shall be performed.
Power dissipation capacitance (C
consumption (I
For both P
and V
patterns used for fault detection. Functional tests shall be performed in sequence as approved by the qualifying activity on
qualified devices. For V
following input values may be used: V
V
Tests at V
for RHA specified devices. For device classes B, S, Q, and V, non-RHA specified devices, functional tests at V
are guaranteed, if not tested.
T
V
V
tests, all paths must be tested.
C
IL
CC
CC
= +25C for screening. Other voltages of V
DEFENSE SUPPLY CENTER COLUMBUS
P
I
= 0.45 V. Allowable tolerances in accordance with MIL-STD-883 for the input voltage levels are already incorporated.
S
= 3.6 V are equal to the limits at V
= 5.5 V are 1.0 ns and guaranteed by guardbanding the V
D
= (C
1/ For SEP test conditions, see 4.4.4.2 herein.
2/ Technology characterization and model verification supplemented by in-line data may be used in lieu of end-of-
over
= (C
IN
MICROCIRCUIT DRAWING
Device
COLUMBUS, OHIO 43218-3990
line testing. Test plan must be approved by TRB and qualifying activity.
type
are to be accurate within 5 percent.
= V
PD
CC
01
03
D
PD
and I
+ C
= 3.0 V are for RHA specified devices only (T
CC
CC
+ C
S
). Where:
or GND. When V
L
= 5.5 V are equal to the limits at V
) V
STANDARD
L
S
) (V
, f is the frequency of the input signal and C
CC
CC
f + I
CC
x V
SEP
SEL
SEL
CC
= 4.5 V, H  2.5 V, L  2.5 V; V
TABLE IA. Electrical performance characteristics - Continued.
CC
)f + (I
PD
IN
CC
) determines both the no load dynamic power consumption (P
= V
x V
CC
IH
CC
= 3.78 V, V
= 3.0 V and guaranteed by testing at V
temperature
CC
or GND is used, the test is guaranteed for V
TABLE IB. SEP test limits.
+125C
+125C
)
10C
T
CC
CC
CC
A
=
= 4.5 V and T
= 5.5 V dc with a 2 ms duration maximum. This test may be performed
and temperatures are guaranteed, if not tested (see 4.4.1d).
CC
IL
= 4.5 V and guaranteed by testing at V
= 0.68 V. For V
IH
A
= 25C ±5C). Functional tests at V
= 3.7 V, V
L
C
CC
is the external output load capacitance.
3.6 V and 5.5 V
3.6 V and 5.5 V
= +125C for sample testing and at V
SIZE
= 4.5 V minimum limits to 1.5 ns. For propagation delay
A
V
CC
IL
CC
1/ 2/
= 0.6 V. For device class M at V
= 3.0 V, H  1.5 V, L  1.5 V; V
REVISION LEVEL
CC
= 3.0 V. Minimum AC limits for
IN
= 3.85 V or 1.65 V. For device
C
 100 MeV-cm
 110 MeV-cm
CC
Effective LET
= 4.5 V. AC limits at
CC
D
) and dynamic current
= 3.0 V are worst case
CC
IH
= 4.5 V and
2
2
CC
SHEET
/mg
/mg
= 2.5 V,
5962-90985
= 4.5 V, the
CC
11
= 3.0 V
trigger