5962-9098501MRA E2V, 5962-9098501MRA Datasheet - Page 20

• Manufacturer Part Number: 5962-9098501MRA
• Manufacturer: E2V

Specifications of 5962-9098501MRA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with
MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturer's TRB in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test
circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1005 of MIL-STD-883.
(see 3.5 herein).
method 1019, condition A, and as specified herein. Prior to and during total dose irradiation characterization and testing, the
devices for characterization shall be biased so that 50 percent are at inputs high and 50 percent are at inputs low, and the
devices for testing shall be biased to the worst case condition established during characterization. Devices shall be biased as
follows:
4.4.3 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.3.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
4.4.3.2 Additional criteria for device classes B, S, Q, and V. The steady-state life test duration, test condition and test
4.4.4 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.5 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
4.4.5.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883,
a.
b.
c.
a.
b.
c.
d.
a.
b.
DEFENSE SUPPLY CENTER COLUMBUS
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1005 of MIL-STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
End-point electrical parameters shall be as specified in table II herein.
For device classes B, S, Q, and V, the devices or test vehicle shall be subjected to radiation hardness assured tests
as specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All
device classes must meet the postirradiation end-point electrical parameter limits as defined in table I at
T
RHA tests for device classes M, B, S, Q, and V for levels M, D, P, L, and R shall be performed through each level to
determine at what levels the devices meet the RHA requirements. These RHA tests shall be performed for initial
qualification and after design or process changes which may affect the RHA performance of the device.
Prior to irradiation, each selected sample shall be assembled in its qualified package. It shall pass the specified
group A electrical parameters in table I for subgroups specified in table II herein.
Inputs tested high, V
open.
Inputs tested low, V
A
A
= +125C, minimum.
= +25C 5C, after exposure, to the subgroups specified in table II herein.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
CC
CC
= 5.5 V dc +5%, R
= 5.5 V dc +5%, R
CC
CC
= 10 ±20%, V
= 10 ±20%, V
IN
SIZE
IN
= 0.0 V, R
A
= 5.0 V dc +5%, R
IN
REVISION LEVEL
= 1 k 20%, and the output is open.
IN
= 1 k 20%, and the output is
C
SHEET
5962-90985
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