PEB2445NV1.2 Lantiq, PEB2445NV1.2 Datasheet - Page 57

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PEB2445NV1.2

Manufacturer Part Number
PEB2445NV1.2
Description
Manufacturer
Lantiq
Datasheet

Specifications of PEB2445NV1.2

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5.2
T
Parameter
Input capacitance
Output capacitance
I/O
5.3
Ambient temperature under bias range,
Inputs are driven to 2.4 V for a logical ‘1’ and to 0.4 V for a logical ‘0’.
Timing measurements are made at 2.0 V for a logical ‘1’ and at 0.8 V for a logical ‘0’.
The AC-testing input/output wave forms are shown below.
Figure 21
I/O-Wave Form for AC-Test
5.3.1
5.3.1.1 Intel Bus Mode
Figure 22
Semiconductor Group
A
P Read Cycle
= 25 C;
2.4 V
0.4 V
Capacitances
AC-Characteristics
Microprocessor Interface Timing
V
DD
= 5 V
2.0 V
0.8 V
5 %,
Test Points
V
SS
= 0 V
V
Symbol
C
C
C
DD
IN
OUT
I/O
57
2.0 V
0.8 V
= 5 V
5 %.
min.
Limit Values
Electrical Characteristics
Device
Test
Under
max.
10
15
20
C
PEB 2445
L
= 150 pF
ITS05853
Unit
pF
pF
pF
02.96

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