MT29F4G08ABBDAH4:D Micron Technology Inc, MT29F4G08ABBDAH4:D Datasheet - Page 51

• Manufacturer Part Number: MT29F4G08ABBDAH4:D
• Description: MICMT29F4G08ABBDAH4:D 4G SLC NAND FLASH
• Manufacturer: Micron Technology Inc

GET FEATURES (EEh)
Figure 31: GET FEATURES (EEh) Operation
PDF: 09005aef83b25735
m60a_4gb_nand.pdf – Rev. J 9/11 EN
The GET FEATURES (EEh) command reads the subfeature parameters (P1–P4) from the
specified feature address. This command is accepted by the target only when all die
(LUNs) on the target are idle.
Writing EEh to the command register puts the target in get features mode. The target
stays in this mode until another valid command is issued.
When the EEh command is followed by a feature address, the target goes busy for
If the READ STATUS (70h) command is used to monitor for command completion, the
READ MODE (00h) command must be used to re-enable data output mode.
After
rameters.
Cycle type
R/B#
I/Ox
t
FEAT completes, the host enables data output mode to read the subfeature pa-
Command
EEh
Address
FA
4Gb, 8Gb, 16Gb: x8, x16 NAND Flash Memory
t WB
51
t FEAT
Micron Technology, Inc. reserves the right to change products or specifications without notice.
t RR
D
P1
OUT
D
P2
OUT
Feature Operations
© 2009 Micron Technology, Inc. All rights reserved.
D
P3
OUT
D
P4
OUT
t
FEAT.